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74HCT4067DB Datasheet(PDF) 13 Page - NXP Semiconductors

Part No. 74HCT4067DB
Description  16-channel analog multiplexer/demultiplexer
Download  29 Pages
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Maker  NXP [NXP Semiconductors]
Homepage  http://www.nxp.com
Logo NXP - NXP Semiconductors

74HCT4067DB Datasheet(HTML) 13 Page - NXP Semiconductors

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74HC_HCT4067_3
© NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 03 — 15 October 2007
13 of 29
NXP Semiconductors
74HC4067; 74HCT4067
16-channel analog multiplexer/demultiplexer
IS(ON)
ON-state leakage current
VCC = 5.5 V; VI = VIH or VIL;
|V
SW| = VCC GND; see Figure 11
--
±8.0
µA
ICC
supply current
VI = VCC or GND; Vis = GND or VCC;
Vos =VCC or GND; VCC = 4.5 V to 5.5 V
-
-
80.0
µA
∆ICC
additional supply current
per input pin; VI = VCC − 2.1 V; other
inputs at VCC or GND; VCC = 4.5 V to 5.5 V
pin E
-
-
270
µA
pin Sn
-
-
225
µA
Tamb = −40 °C to +125 °C
VIH
HIGH-level input voltage
VCC = 4.5 V to 5.5 V
2.0
-
-
V
VIL
LOW-level input voltage
VCC = 4.5 V to 5.5 V
-
-
0.8
V
II
input leakage current
VI = VCC or GND; VCC = 5.5 V
-
-
±1.0
µA
IS(OFF)
OFF-state leakage current
VCC = 5.5 V; VI = VIH or VIL;
|V
SW| = VCC GND; see Figure 10
per channel
-
-
±1.0
µA
all channels
-
-
±8.0
µA
IS(ON)
ON-state leakage current
VCC = 5.5 V; VI = VIH or VIL;
|V
SW| = VCC GND; see Figure 11
--
±8.0
µA
ICC
supply current
VI = VCC or GND; Vis = GND or VCC;
Vos =VCC or GND; VCC = 4.5 V to 5.5 V
-
-
160
µA
∆ICC
additional supply current
per input pin; VI = VCC − 2.1 V; other
inputs at VCC or GND; VCC = 4.5 V to 5.5 V
pin E
-
-
294
µA
pin Sn
-
-
245
µA
Table 8.
Static characteristics 74HCT4067 …continued
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
Vis is the input voltage at a Yn or Z terminal, whichever is assigned as an input.
Vos is the output voltage at a Yn or Z terminal, whichever is assigned as an output.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Vis = VCC and Vos = GND
Vis = GND and Vos = VCC
Vis = VCC and Vos = open
Vis = GND and Vos = open
Fig 10. Test circuit for measuring OFF-state leakage
current
Fig 11. Test circuit for measuring ON-state leakage
current
ISW
ISW
001aag734
VIH
Z
VCC
Yn
E
Vos
Vis
GND
ISW
001aag735
VIL
ZYn
E
Vos
Vis
GND
VCC


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