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74HCT4067DB Datasheet(PDF) 19 Page - NXP Semiconductors |
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74HCT4067DB Datasheet(HTML) 19 Page - NXP Semiconductors |
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74HC_HCT4067_3 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 03 — 15 October 2007 19 of 29 NXP Semiconductors 74HC4067; 74HCT4067 16-channel analog multiplexer/demultiplexer 13. Additional dynamic characteristics [1] Adjust input voltage Vis to 0 dBm level (0 dBm = 1 mW into 600 Ω). [2] Adjust input voltage Vis to 0 dBm level at Vos for fi = 1 MHz (0 dBm = 1 mW into 50 Ω). After set-up, fi is increased to obtain a reading of −3 dB at V os. Table 13. Additional dynamic characteristics Recommended conditions and typical values; GND = 0 V; Tamb = 25 °C. Vis is the input voltage at a Yn or Z terminal, whichever is assigned as an input. Vos is the output voltage at a Yn or Z terminal, whichever is assigned as an output. Symbol Parameter Conditions Min Typ Max Unit THD total harmonic distortion RL = 10 kΩ; CL = 50 pF; see Figure 15 fi = 1 kHz VCC = 4.5 V; Vis(p-p) = 4.0 V - 0.04 - % VCC = 9.0 V; Vis(p-p) = 8.0 V - 0.02 - % fi = 10 kHz VCC = 4.5 V; Vis(p-p) = 4.0 V - 0.12 - % VCC = 9.0 V; Vis(p-p) = 8.0 V - 0.06 - % αiso isolation (OFF-state) RL = 600 Ω; CL = 50 pF; see Figure 16 [1] VCC = 4.5 V - −50 - dB VCC = 9.0 V - −50 - dB f(-3dB) −3 dB frequency response RL = 50 Ω;CL = 10 pF; see Figure 17 [2] VCC = 4.5 V - 90 - MHz VCC = 9.0 V - 100 - MHz Csw switch capacitance independent pins Y - 5 - pF common pin Z - 45 - pF Fig 15. Test circuit for measuring total harmonic distortion 10 µF 001aag736 VIL Z GND Yn E Vos D VCC 2RL 2RL CL Vis fi VCC |
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