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H5MS1262EFP-K3E Datasheet(PDF) 59 Page - Hynix Semiconductor |
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H5MS1262EFP-K3E Datasheet(HTML) 59 Page - Hynix Semiconductor |
59 / 62 page Rev 1.1 / July. 2009 59 Mobile DDR SDRAM 128Mbit (8M x 16bit) H5MS1262EFP Series Data mask1,2) Mobile DDR SDRAM uses a DQ write mask enable signal (DM) which masks write data. Data masking is only available in the write cycle for Mobile DDR SDRAM. Data masking is available during write, but data masking during read is not available. DM command masks burst write data with reference to data strobe signal and it is not related with read data. DM com- mand can be initiated at both the rising edge and the falling edge of the DQS. DM latency for write operation is zero. For x16 data I/O, Mobile DDR SDRAM is equipped with LDM and UDM which control DQ0~DQ7 and DQ8~DQ15 respectively. Note: 1) Mobile SDR SDRAM can mask both read and write data, but the read mask is not supported by Mobile DDR SDRAM. 2) Differences in Functions and Specifications (next table) Data Masking (Write cycle: BL=4) Item Mobile DDR SDRAM Mobile SDR SDRAM Data mask Write mask only Write mask/Read mask WRITE WRITE DM CMD CK CK D0 D1 D3 D0 D1 D3 Hi- Z DQS DQ Data Masking Data Masking tDQSS tDQSL tDS tDH tDQSH Hi- Z |
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