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AS1109-BQFT Datasheet(PDF) 11 Page - ams AG |
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AS1109-BQFT Datasheet(HTML) 11 Page - ams AG |
11 / 26 page www.austriamicrosystems.com Revision 1.18 11 - 26 AS1109 Data Sheet - D e t a i l e d D e s c r i p t i o n Figure 14. Switching Global Error Mode Timing Diagram Error-Detection Mode Acquisition of the error status occurs at the rising edge of OEN. Error-detection mode is started on the rising edge of LD when OEN is high. The CLK signal must be low when entering error detection mode. Error detection for open- and shorted-LEDs can only be performed for LEDs that are switched on during test time. To switch between error-detection modes clock pulses are needed (see Table 5). Note: To test all LEDs, a test pattern that turns on all LEDs must be input to the AS1109. Global Error Mode Global error mode is entered when error-detection mode is started. Clock pulses during this period are used to select between temperature, open-LED, and shorted-LED tests, as well as low-current diagnostic mode and shutdown mode (see Table 5). In global error mode, an error flag (TFLAG, OFLAG, SFLAG) is delivered to pin SDO if any errors are encountered. Note: For a valid result SDI must be 1 for the first device. Table 5. Global Error Mode Selections Clock Pulses Output Port Error-Detection Mode Global Error Flag/Shutdown Condition 0 Don't Care Over-Temperature Detection TFLAG = SDO = 1: No over-temperature warning. TFLAG = SDO = 0: Over-temperature warning. 1 Enabled Open-LED Detection OFLAG = SDO = 1: No open-LED error. OFLAG = SDO = 0: Open-LED error. 2 Enabled Shorted-LED Detection SFLAG = SDO = 1: No shorted-LED error. SFLAG = SDO = 0: Shorted-LED error. 3 Don't Care Low-Current Diagnostic Mode 4 Don't Care Shutdown Mode SDI = 1: Wakeup SDI = 0: Shutdown tTESTING tSU(ERROR) OFLAG(IN) SFLAG(IN) TFLAG(IN) TFLAG OFLAG SFLAG tSW(ERROR) SDI OEN LD CLK SDO Acquisition of Error Status Don’t Care Don’t Care tGSW(ERROR) tP(I/O) tP4 tP(I/O) tP(I/O) tSW(ERROR) tGSW(ERROR) tGSW(ERROR) Don’t Care |
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