CY7C1049CV33
Document #: 38-05006 Rev. *G
Page 5 of 12
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ................................. –65
°C to +150°C
Ambient Temperature with
Power Applied ............................................ –55
°C to +125°C
Supply Voltage on VCC to Relative GND[2]–0.5V to +4.6VDC
Voltage Applied to Outputs
in High-Z State[2].................................... –0.5V to VCC + 0.5V
Input Voltage[2] ...................................... –0.5V to VCC + 0.5V
Current into Outputs (LOW) ........................................ 20 mA
Operating Range
Range
Ambient Temperature
VCC
Commercial
0
°C to +70°C3.3V ± 0.3V
Industrial/
Automotive-A
–40
°C to +85°C
Automotive-E
–40
°C to +125°C
Electrical Characteristics
Over the Operating Range
Parameter
Description
Test Conditions
-10
-12
-15
Unit
Min
Max
Min
Max
Min
Max
VOH
Output HIGH Voltage
VCC = Min.; IOH = –4.0 mA
2.4
2.4
2.4
V
VOL
Output LOW Voltage
VCC = Min.,; IOL = 8.0 mA
0.4
0.4
0.4
V
VIH
Input HIGH Voltage
2.0
VCC
+ 0.3
2.0
VCC
+ 0.3
2.0
VCC
+ 0.3
V
VIL
Input LOW Voltage[2]
–0.3
0.8
–0.3
0.8
–0.3
0.8
V
IIX
Input Load Current
GND < VI < VCC
Com’l/Ind’l/
Auto-A
–1
+1
–1
+1
μA
Auto-E
–20
+20
ICC
VCC Operating
Supply Current
VCC = Max.,
f = fMAX = 1/tRC
Com’l
90
85
mA
Ind’l/Auto-A
100
95
Auto-E
95
ISB1
Automatic CE
Power Down Current
—TTL Inputs
Max. VCC, CE > VIH;
VIN > VIH or
VIN < VIL, f = fMAX
Com’l/Ind’l/
Auto-A
40
40
mA
Auto-E
45
mA
ISB2
Automatic CE
Power Down Current
—CMOS Inputs
Max. VCC,
CE > VCC – 0.3V,
VIN > VCC – 0.3V,
or VIN < 0.3V, f = 0
Com’l/Ind’l/
Auto-A
10
10
mA
Auto-E
15
mA
Capacitance
Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
Test Conditions
Max
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
VCC = 3.3V
8pF
COUT
I/O Capacitance
8
pF
Thermal Resistance
Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
Test Conditions
36-Pin SOJ
44-TSOP-II
Unit
Θ
JA
Thermal Resistance (Junction
to Ambient)
Test conditions follow standard
test methods and procedures for
measuring thermal impedance,
per EIA / JESD51.
46.51
41.66
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
18.8
10.56
°C/W
Notes
2. VIL (min) = –2.0V and VIH(max) = VCC + 0.5V for pulse durations of less than 20 ns.
3. Tested initially and after any design or process changes that may affect these parameters.
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