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LFD3L5-61-XX-PF Datasheet(PDF) 9 Page - LIGITEK electronics co., ltd.

Part No. LFD3L5-61-XX-PF
Description  FOUR DIGIT LED DISPLAY (0.52 Inch)
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Maker  LIGITEK [LIGITEK electronics co., ltd.]
Homepage  http://www.ligitek.com
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LFD3L5-61-XX-PF Datasheet(HTML) 9 Page - LIGITEK electronics co., ltd.

   
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This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
1.T.Sol=260
℃±5
2.Dwell time= 10
±1sec.
1.T.Sol=230
℃±5
2.Dwell time=5
±1sec
Solderability Test
Solder Resistance
Test
This test intended to see soldering well
performed or not.
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
JIS C 7021: B-12
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
MIL-STD-883:1008
JIS C 7021: B-10
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-202:103B
JIS C 7021: B-11
Test Condition
1.Ta=-40
℃±5
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=105
℃±5&-40℃±5
(10min) (10min)
2.total 10 cycles
1.Ta=65
℃±5
2.RH=90 %~95%
3.t=240hrs
±2hrs
1.Ta=105
℃±5
2.t=1000 hrs (-24hrs, +72hrs)
1.Under Room Temperature
2.If=10mA
3.t=1000 hrs (-24hrs, +72hrs)
Low Temperature
Storage Test
High Temperature
High Humidity Test
Thermal Shock Test
High Temperature
Storage Test
Operating Life Test
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
The purpose of this test is the resistance
of the device under tropical for hours.
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
Reliability Test:
Test Item
Description
Reference
Standard
Page 8/8
PART NO. LFD3L5/61-XX-PF


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