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TXS0206-29YFPR Datasheet(PDF) 6 Page - Texas Instruments |
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TXS0206-29YFPR Datasheet(HTML) 6 Page - Texas Instruments |
6 / 23 page TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com ABSOLUTE MAXIMUM RATINGS (1) Level Translator over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT VCCA Supply voltage range –0.5 4.6 V I/O ports (A port) –0.5 4.6 VI Input voltage range I/O ports (B port) –0.5 4.6 V Control inputs –0.5 4.6 A port –0.5 4.6 Voltage range applied to any output in the high-impedance or VO V power-off state B port –0.5 4.6 A port –0.5 4.6 VO Voltage range applied to any output in the high or low state V B port –0.5 4.6 IIK Input clamp current VI < 0 –50 mA IOK Output clamp current VO < 0 –50 mA IO Continuous output current ±50 mA Continuous current through VCCA or GND ±100 mA Tstg Storage temperature range –65 150 °C (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. THERMAL IMPEDANCE RATINGS TYP UNIT θJA Package thermal impedance(1) 117 °C/W (1) The package thermal impedance is calculated in accordance with JESD 51-7. ABSOLUTE MAXIMUM RATINGS (1) LDO over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT VIN Input voltage range 2.3 6.5 V VOUT Output voltage range –0.3 4.6 V Peak output current 220 mA Continuous total power dissipation TBD mW TJ Junction temperature range –55 150 °C Tstg Storage temperature range –55 150 °C (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 6 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated |
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