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CY14E256LA
Document Number: 001-54952 Rev. *B
Page 9
AC Test Conditions
Input Pulse Levels ....................................................0V to 3V
Input Rise and Fall Times (10% - 90%) ........................ <3 ns
Input and Output Timing Reference Levels .................... 1.5V
Data Retention and Endurance
Parameter
Description
Min
Unit
DATAR
Data Retention
20
Years
NVC
Nonvolatile STORE Operations
1,000
K
Capacitance
Parameter[10]
Description
Test Conditions
Max
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
VCC = VCC (Typ)
7pF
COUT
Output Capacitance
7
pF
Thermal Resistance
Parameter[10]
Description
Test Conditions
44-TSOP II
32-SOIC
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
41.74
41.55
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
11.90
24.43
°C/W
Figure 3. AC Test Loads
5.0V
OUTPUT
5 pF
R1
R2
512
Ω
5.0V
OUTPUT
30 pF
R1
R2
512
Ω
for tri-state specs
963
Ω
963
Ω
Note
10. These parameters are guaranteed by design and are not tested.
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