IKCS08F60B2C datasheet(10/19 Pages) INFINEON

Part #	IKCS08F60B2C

Description	Control integrated Power System

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Manufacturer	INFINEON [Infineon Technologies AG]

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CIPOS™ IKCS08F60B2A

IKCS08F60B2C

Data Sheet

10/19

Rev. 2, March 2009

Static Characteristics

(Tc = 25°C, VDD = 15V, if not stated otherwise)

Value

Description

Condition

Symbol

min

typ

max

Unit

Collector-Emitter breakdown voltage VIN = 5V, IC = 0.25mA

V(BR)CES

600

V

Collector-Emitter saturation voltage

VDD = 15V, Iout = +/- 4A

TvJ = 25°C

TvJ = 150°C

VCE(sat)

-

1.6

1.8

2.1

V

Diode forward voltage

VIN = 5V, Iout = +/- 4A

TvJ = 25°C

TvJ = 150°C

VF

-

1.75

1.7

2.05

V

Zero gate voltage collector current

of IGBT

VCE = 600V, VIN = 5V

TvJ = 25°C

TvJ = 150°C

ICES

-

40

1000

µA

Short circuit collector current

1

VDD = 15V, tSC ≤ 5µs

VCC =400V, TvJ =150°C

IC(SC)

2

-

21

-

A

Logic "0" input voltage (LIN,HIN)

VIH

1.7

2.1

2.4

V

Logic "1" input voltage (LIN,HIN)

VIL

0.7

0.9

1.1

V

ITRIP positive going threshold

VIT,TH+

360

460

540

mV

ITRIP input hysteresis

VIT,HYS

45

75

-

mV

VDD and VBS supply undervoltage

positive going threshold

VDDUV+

VBSUV+

2

11.0

12.1

12.8

V

VDD and VBS supply undervoltage

negative going threshold

VDDUV-

VBSUV-

2

9.5

10.4

11.0

V

VCC and VBS supply undervoltage

lockout hysteresis

VDDUVH

VBSUVH

2

1.2

1.7

-

V

Input clamp voltage (/HIN, /LIN)

IIN = 4mA

VINCLAMP

-

10.4

13

V

Input clamp voltage (ITRIP)

IIN = 4mA

VINCLAMP2

-

10.6

13

V

Quiescent VBx supply current (VBx

only)

VHIN = low

IQB

-

300

550

µA

Quiescent VDD supply current

(VDD only)

VIN = float

IQDD

-

2.4

3.4

mA

Input bias current

VIN = 5V

IIN+

-

55

100

µA

Input bias current

VIN = 0V

IIN-

-

220

400

µA

ITRIP Input bias current

VITRIP = 5V

IITRIP+

-

75

120

µA

Leakage current of high side

Tj,IC = 125°C

ILVS

2

-

30

-

µA

FAULT low on resistance of the pull

down transistors

VFLT = 0.5V, VITRIP = 1V

Ron,FLT

-

56

-

Ω

1 Allowed number of short circuits: <1000; time between short circuits: >1s.

2 Test is not subject of product test, verified by characterisation

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