EDE1116ACSE-6ELI-E datasheet(15/75 Pages) ELPIDA

Part #	EDE1116ACSE-6ELI-E

Description	1G bits DDR2 SDRAM WTR (Wide Temperature Range)

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Manufacturer	ELPIDA [Elpida Memory]

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EDE1116ACSE-LI

Data Sheet E1103E20 (Ver. 2.0)

15

AC Input Test Conditions

Parameter

Symbol

Value

Unit

Notes

Input reference voltage

VREF

0.5

× VDDQ

V

1

Input signal maximum peak to peak swing

VSWING (max.)

1.0

V

1

Input signal minimum slew rate

SLEW

1.0

V/ns

2, 3

Notes: 1. Input waveform timing is referenced to the input signal crossing through the VIH/IL (AC) level applied to

the device under test.

2. The input signal minimum slew rate is to be maintained over the range from VREF to VIH (AC) min. for

rising edges and the range from VREF to VIL (AC) max. for falling edges as shown in the below figure.

3. AC timings are referenced with input waveforms switching from VIL (AC) to VIH (AC) on the positive

transitions and VIH (AC) to VIL (AC) on the negative transitions.

VSWING(max.)

∆TR

∆TF

VREF

− VIL (AC)(max.)

∆TF

Falling slew =

VDDQ

VIH (AC)(min.)

VIH (DC)(min.)

VIL (DC)(max.)

VIL (AC)(max.)

VSS

VREF

VIH (AC) min.

− VREF

∆TR

Rising slew =

AC Input Test Signal Wave forms

VTT

Measurement point

DQ

RT =25

Ω

Output Load

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