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LTM9001IV-BA Datasheet(PDF) 7 Page - Linear Technology |
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LTM9001IV-BA Datasheet(HTML) 7 Page - Linear Technology |
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7 / 28 page  LTM9001-Ax/LTM9001-Bx 7 9001fb tH tD tC tL N – 7 N – 6 N – 5 N – 4 N – 3 ANALOG INPUT ENC– ENC+ CLKOUT – CLKOUT+ D0-D15, OF 9001 TD01 tAP N + 1 N + 2 N + 4 N + 3 N LVDS Output Mode Timing All Outputs are Differential and Have LVDS Levels TIMING DIAGRAM Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: All voltage values are with respect to ground with GND and OGND wired together (unless otherwise noted). Note 3: Gain is measured from IN+/IN– through the ADC. The amplifier gain is attenuated by the filter, (See the typical performance characteristics section for “IF Frequency Response”). Note 4: VCC = VDD = 3.3V, fSAMPLE = maximum sample frequency, LVDS outputs, differential ENC+/ENC– = 2VP-P with 1.6V common mode, input range = –1dBFS with PGA = 0 with differential drive, AC-coupled inputs, unless otherwise noted. Note 5: Integral nonlinearity is defined as the deviation of a code from a “best fit straight line” to the transfer curve. The deviation is measured from the center of the quantization band. Note 6: Offset error is the voltage applied between the IN+ and IN– pins required to make the output code flicker between 0000 0000 0000 0000 and 1111 1111 1111 1111. Note 7: Guaranteed by design, not subject to test. Note 8: Recommended operating conditions. TIMING CHARACTERISTICS SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS CMOS Output Mode tD ENC to DATA Delay (Note 7) l 1.3 2.7 4 ns tC ENC to CLKOUT Delay (Note 7) l 1.3 2.7 4 ns tSKEW DATA to CLKOUT Skew (tC – tD) (Note 7) l 4.3 10 ns Data Latency Full Rate CMOS Demuxed 7 7 Cycles Cycles The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) |
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