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PRELIMINARY
CY14B101LA, CY14B101NA
Document #: 001-42879 Rev. *C
Page 9 of 24
AC Test Conditions
Input Pulse Levels ....................................................0V to 3V
Input Rise and Fall Times (10% - 90%) ........................ <3 ns
Input and Output Timing Reference Levels .................... 1.5V
Data Retention and Endurance
Parameter
Description
Min
Unit
DATAR
Data Retention
20
Years
NVC
Nonvolatile STORE Operations
200
K
Capacitance
Parameter[13]
Description
Test Conditions
Max
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
VCC = VCC (Typ)
7pF
COUT
Output Capacitance
7
pF
Thermal Resistance
Parameter[13]
Description
Test Conditions
54-TSOP II 48-SSOP 44-TSOP II
32-SOIC
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard
test methods and procedures for
measuring thermal impedance,
in accordance with EIA/JESD51.
30.73
TBD
31.11
TBD
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
6.08
TBD
5.56
TBD
°C/W
Figure 5. AC Test Loads
3.0V
OUTPUT
5 pF
R1
R2
789
Ω
3.0V
OUTPUT
30 pF
R1
R2
789
Ω
for tristate specs
577
Ω
577
Ω
Note
13. These parameters are guaranteed by design and are not tested.
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