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PCS2I99447G-32-ET Datasheet(PDF) 3 Page - PulseCore Semiconductor

Part # PCS2I99447G-32-ET
Description  3.3V/2.5V 1:9 LVCMOS Clock Fanout Buffer
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Manufacturer  PULSECORE [PulseCore Semiconductor]
Direct Link  http://www.onsemi.com/
Logo PULSECORE - PulseCore Semiconductor

PCS2I99447G-32-ET Datasheet(HTML) 3 Page - PulseCore Semiconductor

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September 2006
PCS2I99447
rev 0.4
3.3V/2.5V 1:9 LVCMOS Clock Fanout Buffer
3 of 14
Notice: The information in this document is subject to change without notice.
Table 1. Function Table
Control
Default
0
1
CLK_SEL
1
CLK0 input selected
CLK1 input selected
OE
1
Outputs disabled (high–impedance state)
1
Outputs enabled
CLK_STOP
1
Outputs synchronously stopped in logic low state
Outputs active
Note: 1. OE = 0 will high–impedance tristate all outputs independent on CLK_STOP
Table 2. Pin Configuration
Pin #
Pin Name
I/O
Type
Function
3
CCLK0
Input
LVCMOS
Clock signal input
4
CCLK1
Input
LVCMOS
Alternative clock signal input
2
CLK_SEL
Input
LVCMOS
Clock input select
5
CLK_STOP
Input
LVCMOS
Clock output enable/disable
6
OE
Input
LVCMOS
Output enable/disable
(high–impedance tristate)
11,13,15,19,21,23,26,28,30
Q0 – Q8
Output
LVCMOS
Clock outputs
1,8,9,12,16,17,20,24,25,29,32
GND
Supply
Ground
Negative power supply (GND) for
Output and Core
7,10,14,18,22,27,31
VCC
Supply
VCC
Positive power supply for I/O and
core. All VCC pins must be connected
to the positive power supply for
correct operation
Table 3. General Specifications
Symbol
Characteristics
Min
Typ
Max
Unit
Condition
VTT
Output termination voltage
VCC ÷2
V
MM
ESD protection (Machine model)
200
V
HBM
ESD protection (Human body model)
2000
V
LU
Latch-up immunity
200
mA
CPD
Power dissipation capacitance
10
pF
Per output
CIN
Input capacitance
4.0
pF
Inputs
Table 4. Absolute Maximum Ratings
1
Symbol
Characteristics
Min
Max
Unit
Condition
VCC
Supply Voltage
-0.3
3.9
V
VIN
DC Input Voltage
-0.3
VCC + 0.3
V
VOUT
DC Output Voltage
-0.3
VCC + 0.3
V
IIN
DC Input Current
±20
mA
IOUT
DC Output Current
±50
mA
TS
Storage temperature
-65
125
°C
Note: 1.These are stress ratings only and are not implied for functional use. Exposure to absolute maximum ratings for prolonged periods of time may affect
device reliability.


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