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SDI565047-103F Datasheet(PDF) 3 Page - Superworld Electronics |
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SDI565047-103F Datasheet(HTML) 3 Page - Superworld Electronics |
3 / 7 page Temp MIL-STD-202G Method 108A Time T More than 95% of termincal electrode should SUPERWORLD ELECTRONICS (S) PTE LTD NOTE : Specifications subject to change without notice. Please check our website for latest information. MIL-STD-202G Method 208H Physical Characteristics Tests Reference documents: IPC J-STD-002B Solderability Test be covered with solder. PG. 3 31.07.2008 Solder : Sn(63)/Pb(37) Flux : rosin flux Dip time : 5 secs. Solder temperature : 245±5°C -40°C 1. No case deformation or change in appearance. 1. No case deformation or change in appearance. 1. No case deformation or change in appearance. Reference documents: MIL-STD-202G Method 107G Thermal shock test Reference documents: 4. DCR/DCR<10% T : weight< 28g : 15 Min. 28g<weight<136g : 30 Min. 2. L/L<30% (Closed Magnetic Circuit) 3. Q/Q < 30% L/L<10% MIL-STD-202G Method 103B 4. DCR/DCR<10% 3. Q/Q < 30% 3. Q/Q < 30% Humidity Test IEC 68-2-1A 6.1 6.2 2. L/L<30% (Closed Magnetic Circuit) L/L<10% 4. DCR/DCR<10% Low Temperature Storage Test Reference documents: 2. L/L<30% (Closed Magnetic Circuit) L/L<10% 4. DCR/DCR<10% Change time < 5 min Room Temp 0 Temp 125°C Conditions of 1 cycle : Step 2 : 125°C for T time Step 1 : -40°C for T time Total : 20 cycles T Tested after 1 hour (less than 2 hours) at room temperature Tested while the specimens are still in the chamber 96H High temperature 93%RH 0 High humidity Time : 96±2 hours Temp & Humidity 40°C Conditions 1H Test Time Room Dry oven at temperature of 40±5°C for 24 hours Exposure : Temperature : 40±2°C, Humidity : 93±3% RH, Temp Measured after 24 hours Low temperature 0 -25°C Room Temp 96H Test Time 96H Tested after 1 hour (less than 2 hours) at room temperature Temperature : -25±2°C Time : 96±2 hours Room 0 Temp High temperature 85°C Test 1H Time 1. No case deformation or change in appearance. High Temperature Storage Test 6. RELIABILITY AND TEST CONDITION : Reference documents: Environmental Tests ITEM 2. L/L<30% (Closed Magnetic Circuit) L/L<10% 3. Q/Q < 30% PERFORMANCE Tested after 1 hour (less than 2 hours) at room temperature TEST CONDITION Temperature : 85±2°C Time : 96±2 hours SDI565047 SERIES WIREWOUND CHIP INDUCTORS |
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