SN74ALVC162334

16-BIT UNIVERSAL BUS DRIVER

WITH 3-STATE OUTPUTS

SCES127C – FEBRUARY 1998 – REVISED FEBRUARY 1999

1

POST OFFICE BOX 655303

Widebus

™ Family

CMOS) Submicron Process

Resistors, So No External Resistors Are

Required

and 200-Pin SDRAM Buffered DIMM

Specification

MIL-STD-883, Method 3015; Exceeds 200 V

Using Machine Model (C = 200 pF, R = 0)

JESD 17

Small-Outline (DL), Thin Shrink

Small-Outline (DGG), and Thin Very

Small-Outline (DGV) Packages

description

This 16-bit universal bus driver is designed for

Data flow from A to Y is controlled by the

output-enable (OE) input. The device operates in

the transparent mode when the latch-enable (LE)

input is low. When LE is high, the A data is latched

if the clock (CLK) input is held at a high or low logic

level. If LE is high, the A data is stored in the

latch/flip-flop on the low-to-high transition of CLK.

When OE is high, the outputs are in the

high-impedance state.

The outputs, which are designed to sink up to 12 mA, include equivalent 26-

Ω resistors to reduce overshoot

and undershoot.

resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN74ALVC162334 is characterized for operation from –40

°C to 85°C.

Copyright

© 1999, Texas Instruments Incorporated

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

DGG, DGV, OR DL PACKAGE

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OE

Y1

Y2

GND

Y3

Y4

Y5

Y6

GND

Y7

Y8

Y9

Y10

GND

Y11

Y12

Y13

Y14

GND

Y15

Y16

NC

CLK

A1

A2

GND

A3

A4

A5

A6

GND

A7

A8

A9

A10

GND

A11

A12

A13

A14

GND

A15

A16

LE

NC – No internal connection

EPIC and Widebus are trademarks of Texas Instruments Incorporated.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.