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SN74LVT8996PWR Datasheet(PDF) 2 Page - Texas Instruments

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Part # SN74LVT8996PWR
Description  3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
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SN74LVT8996PWR Datasheet(HTML) 2 Page - Texas Instruments

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SN54LVT8996, SN74LVT8996
3.3-V 10-BIT ADDRESSABLE SCAN PORTS
MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS
SCBS686A – APRIL 1997 – REVISED DECEMBER 1999
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
These devices are functionally equivalent to the ’ABT8996 ASPs. Additionally, they are designed specifically
for low-voltage (3.3-V) VCC operation, but with the capability to interface to 5-V masters and/or targets.
Conceptually, the ASP is a simple switch that can be used to directly connect a set of multidrop primary TAP
signals to a set of secondary TAP signals – for example, to interface backplane TAP signals to a board-level
TAP. The ASP provides all signal buffering that might be required at these two interfaces. When primary and
secondary TAPs are connected, only a moderate propagation delay is introduced – no storage/retiming
elements are inserted. This minimizes the need for reformatting board-level test vectors for in-system use.
Most operations of the ASP are synchronous to the primary test clock (PTCK) input. PTCK is always buffered
directly onto the secondary test clock (STCK) output.
Upon power up of the device, the ASP assumes a condition in which the primary TAP is disconnected from the
secondary TAP (unless the bypass signal is used, as below). This reset condition also can be entered by the
assertion of the primary test reset (PTRST) input or by use of shadow protocol. PTRST is always buffered
directly onto the secondary test reset (STRST) output, ensuring that the ASP and its associated secondary TAP
can be reset simultaneously.
When connected, the primary test data input (PTDI) and primary test mode select (PTMS) input are buffered
onto the secondary test data output (STDO) and secondary test mode select (STMS) output, respectively, while
the secondary test data input (STDI) is buffered onto the primary test data output (PTDO). When disconnected,
STDO is at high impedance, while PTDO is at high impedance, except during acknowledgment of a shadow
protocol. Upon disconnect of the secondary TAP, STMS holds its last low or high level, allowing the secondary
TAP to be held in its last stable state. Upon reset of the ASP, STMS is high, allowing the secondary TAP to be
synchronously reset to the Test-Logic-Reset state.
In system, primary-to-secondary connection is based on shadow protocols that are received and acknowledged
on PTDI and PTDO, respectively. These protocols can occur in any of the stable TAP states other than Shift-DR
or Shift-IR (i.e., Test-Logic-Reset, Run-Test/Idle, Pause-DR or Pause-IR). The essential nature of the protocols
is to receive/transmit an address via a serial bit-pair signaling scheme. When an address is received serially
at PTDI that matches that at the parallel address inputs (A9–A0), the ASP serially retransmits its address at
PTDO as an acknowledgment and then assumes the connected (ON) status, as above. If the received address
does not match that at the address inputs, the ASP immediately assumes the disconnected (OFF) status without
acknowledgment.
The ASP also supports three dedicated addresses that can be received globally (that is, to which all ASPs
respond) during shadow protocols. Receipt of the dedicated disconnect address (DSA) causes the ASP to
disconnect in the same fashion as a nonmatching address. Reservation of this address for global use ensures
that at least one address is available to disconnect all receiving ASPs. The DSA is especially useful when the
secondary TAPs of multiple ASPs are to be left in different stable states. Receipt of the reset address (RSA)
causes the ASP to assume the reset condition, as above. Receipt of the test-synchronization address (TSA)
causes the ASP to assume a connect status (MULTICAST) in which PTDO is at high impedance but the
connections from PTMS to STMS and PTDI to STDO are maintained to allow simultaneous operation of the
secondary TAPs of multiple ASPs. This is useful for multicast TAP-state movement, simultaneous test operation
(such as in Run-Test/Idle state), and scanning of common test data into multiple like scan chains. The TSA is
valid only when received in the Pause-DR or Pause-IR TAP states.
Alternatively, primary-to-secondary connection can be selected by assertion of a low level at the bypass (BYP)
input. This operation is asynchronous to PTCK and is independent of PTRST and/or power-up reset. This
bypassing feature is especially useful in the board-test environment, since it allows the board-level automated
test equipment (ATE) to treat the ASP as a simple transceiver. When the BYP input is high, the ASP is free to
respond to shadow protocols. Otherwise, when BYP is low, shadow protocols are ignored.


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