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SN54F74 Datasheet(PDF) 1 Page - Texas Instruments |
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SN54F74 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 6 page ![]() SN54F74, SN74F74 DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET SDFS046A – MARCH 1987 – REVISED OCTOBER 1993 Copyright © 1993, Texas Instruments Incorporated 2–1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 • Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs description These devices contain two independent positive- edge-triggered D-type flip-flops. A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input may be changed without affecting the levels at the outputs. The SN54F74 is characterized for operation over the full military temperature range of – 55 °C to 125 °C. The SN74F74 is characterized for operation from 0 °C to 70°C. FUNCTION TABLE INPUTS OUTPUTS PRE CLR CLK D Q Q L H X X H L H LX XL H L LX X H† H† H H ↑ HH L H H ↑ LL H H H L X Q0 Q0 † The output levels are not guaranteed to meet the minimum levels for VOH. Furthermore, this configuration is nonstable; that is, it will not persist when PRE or CLR returns to its inactive (high) level. SN54F74 ...J PACKAGE SN74F74 ...D OR N PACKAGE (TOP VIEW) SN54F74 . . . FK PACKAGE (TOP VIEW) 32 1 20 19 910 11 12 13 4 5 6 7 8 18 17 16 15 14 2D NC 2CLK NC 2PRE 1CLK NC 1PRE NC 1Q NC – No internal connection 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1CLR 1D 1CLK 1PRE 1Q 1Q GND VCC 2CLR 2D 2CLK 2PRE 2Q 2Q PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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