SN54F299, SN74F299

8-BIT UNIVERSAL SHIFT/STORAGE REGISTERS

WITH 3-STATE OUTPUTS

SDFS071A – MARCH 1987 – REVISED OCTOBER 1993

2–3

POST OFFICE BOX 655303

logic diagram (positive logic)

C1

1D

C1

1D

Six

Identical

Channels

Not

Shown†

19

11

12

8

2

3

18

17

S0

S1

SR

(shift right

serial input)

CLK

QA

′

OE1

OE2

SL

(shift left

serial input)

QH

′

716

A/QA

H/QH

9

CLR

1

RR

† I/O ports not shown: B/QB (13), C/QC (6), D/QD (14), E/QE (5), F/QF (15), and G/QG (4).

– 0.5 V to 7 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

– 1.2 V to 7 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Input current range

– 30 mA to 5 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Voltage range applied to any output in the disabled or power-off state

– 0.5 V to 5.5 V

. . . . . . . . . . . . . . . . . . .

Voltage range applied to any output in the high state

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

40 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

40 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

48 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Operating free-air temperature range:

SN54F299

– 55

°C to 125°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

SN74F299

0

°C to 70°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Storage temperature range

– 65

°C to 150°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

NOTE 1: The input voltage ratings may be exceeded provided the input current ratings are observed.