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SN74BCT8244A Datasheet(PDF) 1 Page - Texas Instruments |
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SN74BCT8244A Datasheet(HTML) 1 Page - Texas Instruments |
1 / 26 page SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs D Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT) description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the ’F244 and ’BCT244 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE ™ octal buffers. In the test mode, the normal operation of the SCOPE ™ octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Copyright © 1996, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE is a trademark of Texas Instruments Incorporated. 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 1OE 1Y1 1Y2 1Y3 1Y4 GND 2Y1 2Y2 2Y3 2Y4 TDO TMS 2OE 1A1 1A2 1A3 1A4 2A1 VCC 2A2 2A3 2A4 TDI TCK SN54BCT8244A . . . JT PACKAGE SN74BCT8244A ... DW OR NT PACKAGE (TOP VIEW) 32 1 28 27 12 13 5 6 7 8 9 10 11 25 24 23 22 21 20 19 2A4 TDI TCK NC TMS TDO 2Y4 1A2 1A1 2OE NC 1OE 1Y1 1Y2 426 14 15 16 17 18 SN54BCT8244A . . . FK PACKAGE (TOP VIEW) NC – No internal connection On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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