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SN54ALS244C Datasheet(PDF) 2 Page - Texas Instruments

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Part No. SN54ALS244C
Description  OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS
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Maker  TI [Texas Instruments]
Homepage  http://www.ti.com
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SN54ALS244C Datasheet(HTML) 2 Page - Texas Instruments

 
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SN54ALS244C, SN54AS244A, SN74ALS244C, SN74AS244A
OCTAL BUFFERS AND LINE DRIVERS
WITH 3-STATE OUTPUTS
SDAS142C – JULY 1987 – REVISED AUGUST 1995
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic symbol
logic diagram (positive logic)
1
2
4
6
8
19
11
13
15
17
3
5
7
9
12
14
16
18
1A1
1A2
1A3
1A4
1Y1
2A1
2A2
2A3
2A4
2Y1
1Y2
1Y3
1Y4
2Y2
2Y3
2Y4
2OE
1OE
2
1A1
4
1A2
6
1A3
8
1A4
EN
1
1Y1
18
1Y2
16
1Y3
14
1Y4
12
11
2A1
13
2A2
15
2A3
17
2A4
EN
19
2Y1
9
2Y2
7
2Y3
5
2Y4
3
1OE
2OE
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, VCC
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage, VI
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage applied to a disabled 3-state output
5.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: SN54ALS244C
– 55
°C to 125°C
. . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ALS244C
0
°C to 70°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
– 65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.


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