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CY74FCT821BTSOCT Datasheet(PDF) 4 Page - Texas Instruments |
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CY74FCT821BTSOCT Datasheet(HTML) 4 Page - Texas Instruments |
4 / 10 page CY74FCT821T CY74FCT823T CY74FCT825T 4 Electrical Characteristics Over the Operating Range Parameter Description Test Conditions Min. Typ.[5] Max. Unit VOH Output HIGH Voltage VCC = Min., IOH = −32 mA 2.0 V VOH Output HIGH Voltage VCC = Min., IOH = −15 mA 2.4 3.3 V VOL Output LOW Voltage VCC = Min., IOL = 64 mA 0.3 0.55 V VIH Input HIGH Voltage 2.0 V VIL Input LOW Voltage 0.8 V VH Hysteresis[6] All inputs 0.2 V VIK Input Clamp Diode Voltage VCC = Min., IIN = −18 mA −0.7 −1.2 V II Input HIGH Current VCC = Max., VIN = VCC 5 µA IIH Input HIGH Current VCC = Max., VIN = 2.7V ±1 µA IIL Input LOW Current VCC = Max., VIN = 0.5V ±1 µA IOZH Off State HIGH-Level Output Current VCC = Max., VOUT = 2.7V 10 µA IOZL Off State LOW-Level Output Current VCC = Max., VOUT = 0.5V −10 µA IOS Output Short Circuit Current[7] VCC = Max., VOUT = 0.0V −60 −120 −225 mA IOFF Power-Off Disable VCC = 0V, VOUT = 4.5V ±1 µA Capacitance[6] Parameter Description Typ.[5] Max. Unit CIN Input Capacitance 5 10 pF COUT Output Capacitance 9 12 pF Notes: 5. Typical values are at VCC=5.0V, TA=+25˚C ambient. 6. This parameter is specified but not tested. 7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. |
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