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CY74FCT257ATQCT Datasheet(PDF) 4 Page - Texas Instruments

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Part # CY74FCT257ATQCT
Description  QUAD 2-INPUT MULTIPLEXER WITH 3-STATE OUTPUTS
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

CY74FCT257ATQCT Datasheet(HTML) 4 Page - Texas Instruments

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CY74FCT257T
QUAD 2-INPUT MULTIPLEXER
WITH 3-STATE OUTPUTS
SCCS019D – MAY 1994 – REVISED NOVEMBER 2001
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP†
MAX
UNIT
VIK
VCC = 4.75,
IIN = –18 mA
–0.7
–1.2
V
VOH
VCC = 4.75,
IOH = –32 mA
2
V
VOL
VCC = 4.75,
IOL = 64 mA
0.3
0.55
V
Vhys
All inputs
0.2
V
II
VCC = 5.25 V,
VIN = 5.25 V
5
µA
IIH
VCC = 5.25 V,
VIN = 2.7 V
±1
µA
IIL
VCC = 5.25 V,
VIN = 0.5 V
±1
µA
IOZH
VCC = 5.25 V,
VOUT = 2.7 V
10
µA
IOZL
VCC = 5.25 V,
VOUT = 0.5 V
–10
µA
IOS‡
VCC = 5.25 V,
VOUT = 0 V
–60
–120
–225
mA
Ioff
VCC = 0 V,
VOUT = 4.5 V
±1
µA
ICC
VCC = 5.25 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
0.1
0.2
mA
∆ICC
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.5
2
mA
ICCD¶
VCC = 5.25 V, One input switching at 50% duty cycle, Outputs open,
OE = GND, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
0.06
0.12
mA/
MHz
#
One input switching
at f1 = 10 MHz
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
0.7
1.4
IC#
VCC = 5.25 V,
Outputs open
1
at 50% duty cycle
VIN = 3.4 V or GND
1
2.4
mA
IC#
Outputs open,
OE = GND
Four bits switching
at f1 = 2.5 MHz
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
0.7
1.4||
mA
1
at 50% duty cycle
VIN = 3.4 V or GND
1.7
5.4||
Ci
5
10
pF
Co
9
12
pF
† Typical values are at VCC = 5 V, TA = 25°C.
‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
¶ This parameter is derived for use in total power-supply calculations.
# IC
= ICC + ∆ICC × DH × NT + ICCD(f0/2 + f1 × N1)
Where:
IC
= Total supply current
ICC
= Power-supply current with CMOS input levels
∆ICC = Power-supply current for a TTL high input (VIN = 3.4 V)
DH
= Duty cycle for TTL inputs high
NT
= Number of TTL inputs at DH
ICCD = Dynamic current caused by an input transition pair (HLH or LHL)
f0
= Clock frequency for registered devices, otherwise zero
f1
= Input signal frequency
N1
= Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
|| Values for these conditions are examples of the ICC formula.


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