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BQ4010 Datasheet(PDF) 4 Page - Texas Instruments

Part No. BQ4010
Description  8Kx8 Nonvolatile SRAM
Download  14 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

BQ4010 Datasheet(HTML) 4 Page - Texas Instruments

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AC Test Conditions
Parameter
Test Conditions
Input pulse levels
0V to 3.0V
Input rise and fall times
5 ns
Input and output timing reference levels
1.5 V (unless otherwise specified)
Output load (including scope and jig)
See Figures 1 and 2
Figure 1. Output Load A
Figure 2. Output Load B
Read Cycle (TA = TOPR, VCCmin ≤ VCC ≤ VCCmax)
Symbol
Parameter
-70/-70N
-85/-85N
-150/-150N
-200
Unit
Conditions
Min.
Max.
Min.
Max.
Min.
Max. Min.
Max.
tRC
Read cycle time
70
-
85
-
150
-
200
-
ns
tAA
Address access time
-
70
-
85
-
150
-
200
ns
Output load A
tACE
Chip enable access time
-
70
-
85
-
150
-
200
ns
Output load A
tOE
Output enable to output
valid
-
35
-
45
-
70
-
90
ns
Output load A
tCLZ
Chip enable to output
in low Z
5-
5-
10
-
10
-
ns
Output load B
tOLZ
Output enable to output
in low Z
5-
5-
5
-
5
-
ns
Output load B
tCHZ
Chip disable to output
in high Z
025040
0
60
0
70
ns
Output load B
tOHZ
Output disable to
output in high Z
025030
0
50
0
70
ns
Output load B
tOH
Output hold from
address change
10
-
10
-
10
-
10
-
ns
Output load A
Sept. 1996 D
bq4010/bq4010Y
6-4


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