LTC2751

5

2751f

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Write and Update Timing

I/O Valid to ⎯W⎯R Rising Edge Set-Up

●

18

ns

I/O Valid to ⎯W⎯R Rising Edge Hold

●

18

ns

⎯W⎯R Pulse Width

●

30

ns

UPD Pulse Width

●

30

ns

UPD Falling Edge to ⎯W⎯R Falling Edge

No Data Shoot-Through

●

0ns

⎯W⎯R Rising Edge to UPD Rising Edge

(Note 10)

●

0ns

⎯D/S Valid to ⎯W⎯R Falling Edge Set-Up Time

●

18

ns

⎯W⎯R Rising Edge to ⎯D/S Valid Hold Time

●

18

ns

Readback Timing

⎯W⎯R Rising Edge to Read Rising Edge

●

18

ns

Read Falling Edge to ⎯W⎯R Falling Edge

(Note 10)

●

40

ns

Read Rising Edge to I/O Propagation Delay

●

40

ns

UPD Valid to I/O Propagation Delay

●

40

ns

⎯D/S Valid to Read Rising Edge

(Note 10)

●

18

ns

Read Rising Edge to UPD Rising Edge

No Update

●

9ns

UPD Falling Edge to Read Falling Edge

No Update

●

9ns

READ Falling Edge to UPD Rising Edge

(Note 10)

●

18

ns

I/O Bus Hi-Z to Read Rising Edge

(Note 10)

●

0ns

Read Falling Edge to I/O Bus Active

(Note 10)

●

40

ns

⎯C⎯L⎯R Timing

⎯C⎯L⎯R Pulse Width Low

●

30

ns

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: Continuous operation above the specified maximum operating

junction temperature may impair device reliability.

Note 3: Because of the proprietary SoftSpan switching architecture, the

measured resistance looking into each of the specified pins is constant for

of 1.7μs can be achieved by optimizing the time constant on an individual

basis. See Application Note 74, “Component and Measurement Advances

Ensure 16-Bit DAC Settling Time.”

Note 6: Measured at the major carry transition, 0V to 5V range. Output

Note 7. Full-scale transition; REF = 0V.

amplifier = LT1469.

(Boltzmann constant), R = resistance (Ω), T = temperature (°K), and B =

bandwidth (Hz).

Note 10. Guaranteed by design. Not production tested.