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A14100A-1CQ256E Datasheet(PDF) 9 Page - Actel Corporation |
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A14100A-1CQ256E Datasheet(HTML) 9 Page - Actel Corporation |
9 / 98 page 9 Hi R e l F P GA s Ac t e l Ex t end ed Fl ow 1 Notes: 1. Actel offers the extended flow for customers who require additional screening beyond the requirements of the MIL-STD-833, Class B. Actel is compliant to the requirements of MIL-STD-883, Paragraph 1.2.1, and MIL-I-38535, Appendix A. Actel is offering this extended flow incorporating the majority of the screening procedures as outlined in Method 5004 of MIL-STD-883, Class S. The exceptions to Method 5004 are shown in notes 2 and 3 below. 2. Wafer lot acceptance is performed to Method 5007; however, the step coverage requirement as specified in Method 2018 must be waived. 3. MIL-STD-883, Method 5004 requires 100 percent Radiation latch-up testing (Method 1020). Actel will not be performing any radiation testing, and this requirement must be waived in its entirety. Step Screen Method Require- ment 1. Wafer Lot Acceptance2 5007 with Step Coverage Waiver All Lots 2. Destructive In-Line Bond Pull3 2011, Condition D Sample 3. Internal Visual 2010, Condition A 100% 4. Serialization 100% 5. Temperature Cycling 1010, Condition C 100% 6. Constant Acceleration 2001, Condition D or E, Y1 Orientation Only 100% 7. Particle Impact Noise Detection 2020, Condition A 100% 8. Radiographic 2012 (one view only) 100% 9. Pre-Burn-In Test In accordance with applicable Actel device specification 100% 10. Burn-in Test 1015, Condition D, 240 hours @ 125°C minimum 100% 11. Interim (Post-Burn-In) Electrical Parameters In accordance with applicable Actel device specification 100% 12. Reverse Bias Burn-In 1015, Condition C, 72 hours @ 150°C minimum 100% 13. Interim (Post-Burn-In) Electrical Parameters In accordance with applicable Actel device specification 100% 14. Percent Defective Allowable (PDA) Calculation 5%, 3% Functional Parameters @ 25°C All Lots 15. Final Electrical Test a. Static Tests (1) 25°C (Subgroup 1, Table1) (2) –55°C and +125°C (Subgroups 2, 3, Table 1) b. Functional Tests (1) 25°C (Subgroup 7, Table 15) (2) –55°C and +125°C (Subgroups 8A and B, Table 1) c. Switching Tests at 25°C (Subgroup 9, Table 1) In accordance with Actel applicable device specification which includes a, b, and c: 5005 5005 5005 5005 5005 100% 100% 100% 100% 16. Seal a. Fine b. Gross 1014 100% 17. External Visual 2009 100% |
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