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TC520ACOE Datasheet(PDF) 2 Page - TelCom Semiconductor, Inc |
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TC520ACOE Datasheet(HTML) 2 Page - TelCom Semiconductor, Inc |
2 / 8 page 3-40 TELCOM SEMICONDUCTOR, INC. TC520A SERIAL INTERFACE ADAPTER FOR TC500 A/D CONVERTER FAMILY ELECTRICAL CHARACTERISTICS: VDD = 5V, fosc = 1 MHz, TA = +25°C, unless otherwise specified. Symbol Parameter Min Typ Max Unit Supply VDD Operating Voltage Range 4.5 5 5.5 V IDD Supply Current — 0.8 1.5 mA Input Characteristics VIL Low Input Voltage — — 0.8 V VIH High Input Voltage 2.0 — — V IIL Input Leakage Current — — 10 µA IPD Pull-down Current (CE) — 5 — µA IPU Pull-up Current (READ, LOAD) — 5 — µA Output Characteristics (IOUT = 250 µA, VDD = 5V) VOL Low Output Voltage — 0.2 0.3 V VOH High Output Voltage 3.5 4.3 — V tR, tF CL = 10pF, Rise/Fall Times — — 250 nsec Oscillator (OSCIN, OSCOUT) fXTL Crystal Frequency — 1.0 4.0 MHz fOSC External Frequency (OSCIN) — — 6.0 MHz Timing Characteristics tRD READ Delay Time 250 — — nsec tRS Data Read Setup Time 1 — — µsec tDRS DCLK to DOUT Delay 450 — — nsec tLS LOAD Setup Time 1 — — µsec tDLS Data Load Setup Time 50 — — nsec tPWL DCLK Pulse Width Low Time 150 — — nsec tPWH DCLK Pulse Width High Time 150 — — nsec tLDL Load Default Low Time 250 — — nsec tLDS Load Default Setup Time 250 — — nsec Parameter tIZ Integrator ZERO Time — 0.5 — msec tAZI Autozero (RESET) Time at Power-Up — 100 — msec ABSOLUTE MAXIMUM RATINGS* DC Supply Voltage (VDD) ........................................ +6.0V Input Voltage, All Inputs (VIN) ............ – 0.3V to VDD +0.3V Operating Temperature Range (TA) ............. 0°C to +70°C Storage Temperature Range (TSTG) ..... – 65°C to +150°C Lead Temperature (Soldering, 10 sec) (TSDR) ...... +300°C * Static-sensitive device. Unused devices must be stored in conductive material. Protect devices from static discharge and static fields. Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the Operational Specifications is not implied. Any exposure to Absolute Maximum Rating Conditions may affect device reliability. |
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