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TC1072 Datasheet(PDF) 2 Page - TelCom Semiconductor, Inc

Part No. TC1072
Description  50mA CMOS LDO WITH SHUTDOWN, ERROR OUTPUT AND VREF BYPASS
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Maker  TELCOM [TelCom Semiconductor, Inc]
Homepage  http://www.telcom-semi.com
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TC1072 Datasheet(HTML) 2 Page - TelCom Semiconductor, Inc

 
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PRELIMINARY INFORMATION
TC1072
2
50mA CMOS LDO WITH SHUTDOWN,
ERROR OUTPUT AND VREF BYPASS
TC1072-01
6/16/97
ELECTRICAL CHARACTERISTICS: VIN = VOUT + 1V, IL = 0.1mA, CL = 3.3µF, SHDN > VIH, TA = 25
°C, unless other-
wise specified.BOLDFACE type specifications apply for junction temperatures of
– 40
°C to +125°C.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
VIN
Input Operating Voltage
6.5
V
IOUTMAX
Maximum Output Current
50
——
mA
VOUT
Output Voltage
Note 1
VR – 2.5%
VR ±0.5%
VR + 2.5%
V
TC VOUT
VOUT Temperature Coefficient
Note 2
ppm/
°C
40
∆VOUT/∆VIN
Line Regulation
(VR + 1V) < VIN < 6V
0.05
%/V
∆VOUT/VOUT
Load Regulation
IL = 0.1mA to IOUTMAX
0.5
%
(Note 3)
VIN – VOUT
Dropout Voltage (Note 4)
IL = 0.1mA
5
mV
IL = 20mA
65
IL = 50mA
95
(Note 4)
IGND
Ground Pin Current
IL = IOUTMAX, (Note 5)
0
µA
IIN
Supply Current
SHDN = VIH, IL = 0
50
µA
IINSD
Shutdown Supply Current
SHDN = 0V
0.05
µA
PSRR
Power Supply Rejection Ratio
FRE ≤ 1kHz
64
dB
IOUTSC
Output Short Circuit Current
VOUT = 0V
200
450
mA
∆VOUT/∆PD
Thermal Regulation
Note 6
0.04
%/W
eN
Output Noise
IL = IOUTMAX
260
nV/
√Hz
470pF from Bypass to GND
SHDN Input
VIH
SHDN Input High Threshold
VIN = 2.5V to 6.5V
45
%VIN
VIL
SHDN Input Low Threshold
VIN = 2.5V to 6.5V
15
%VIN
ABSOLUTE MAXIMUM RATINGS*
Input Voltage ................................................................. 7V
Output Voltage .................................. (– 0.3) to (VIN + 0.3)
Power Dissipation .................... Internally Limited (Note 7)
Operating Temperature .................... – 40
°C < TJ < 125°C
Storage Temperature ............................ – 65
°C to +150°C
Maximum Voltage on Any Pin ........... VIN + 0.3V to – 0.3V
Lead Temperature (Soldering, 10 Sec.) ................ +260
°C
*Stresses beyond those listed under "Absolute Maximum Ratings" may
cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.


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