© 2008 Fairchild Semiconductor Corporation

www.fairchildsemi.com

FAN7387 Rev. 1.0.0

9

Switching Definitions

Figure 7. Test Circuit for Self-oscillation Method

Figure 8. Basic Operating Waveforms of

Self-oscillation

Figure 9. Shutdown Delay Definition

Figure 10. Test Circuit for Forced-oscillation Method

Using External Signal

Figure 11. Basic Operation Waveforms of Forced-oscillation Method Using External Signal

VDD

RCT

VB

HO

VS

LO

GND

8

5

6

7

1

2

3

4

DT/SD

RDT

10µF

0.1µF

1000pF

1000pF

+14V

10µF

100nF

CT

RT

470nF

FAN7387 Ver1.0

RCT

HO

LO

DT

HO or LO

90%

50%

DT/SD

VDD

RCT

VB

HO

VS

LO

GND

8

5

6

7

1

2

3

4

DT/SD

PWM+DC offset

RDT

10µF

0.1µF

1000pF

1000pF

+14V

+14V

0.1µF

10µF

470nF

RCT

50%

50%

HO

90%

90%

10%

10%

50%

50%

DT

50%

LO

50%

90%

DT/ SD