Specifications ispLSI 2032VE

4

Switching Test Conditions

Input Pulse Levels

Table 2-0003/2032VE

Input Rise and Fall Time

10% to 90%

Input Timing Reference Levels

Output Timing Reference Levels

Output Load

GND to 3.0V

1.5V

1.5V

See Figure 2

3-state levels are measured 0.5V from

steady-state active level.

≤ 1.5 ns

Output Load Conditions (see Figure 2)

DC Electrical Characteristics

Over Recommended Operating Conditions

Figure 2. Test Load

+ 3.3V

R1

R2

Device

Output

Test

Point

0213A/2032VE

TEST CONDITION

R1

R2

CL

A

316Ω

348Ω

35pF

B

∞

348Ω

35pF

316Ω

348Ω

35pF

Active High

Active Low

C

316Ω

348Ω

5pF

∞

348Ω

5pF

Active Low to Z

at V +0.5V

OL

Active High to Z

at V

-0.5V

OH

Table 2-0004A/2032VE

SYMBOL

1. One output at a time for a maximum duration of one second. V

= 0.5V was selected to avoid test problems

by tester ground degradation. Characterized but not 100% tested.

2. Measured using two 16-bit counters.

3. Typical values are at V = 3.3V and T = 25°C.

4. Maximum I

varies widely with specific device configuration and operating frequency. Refer to Power Consumption section

of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate

maximum I

.

5. Unused inputs at V = 0V.

Table 2-0007/2032VE

1

PARAMETER

2, 4, 5

Output Low Voltage

Output High Voltage

Input or I/O High Leakage Current

Input or I/O Low Leakage Current

BSCAN Input Low Leakage Current

I/O Active Pull-Up Current

Output Short Circuit Current

Operating Power Supply Current

I = 8 mA

I

= -4 mA

V

≤ V ≤ 5.25V

0V ≤ V ≤ V (Max.)

0V ≤ V ≤ V

0V ≤ V ≤ V

V = 3.3V, V

= 0.5V

V = 0.0V, V = 3.0V

f

= 1MHz

OL

OH

IN

IL

IN

IL

IN

IL

CC

OUT

CLOCK

IL

IH

CONDITION

MIN.

TYP.

MAX.

UNITS

3

–

2.4

–

–

–

–

–

–

–

–

–

–

–

–

–

–

–

80

-300/-225

0.4

–

10

-10

10

-150

-150

-100

V

V

μA

μA

μA

μA

μA

mA

mA

CC

IL

A

OUT

–

–

Others

mA

–

65

CC

IN

CC

CC

(V

- 0.2)V ≤ V ≤ V

CC

IN

CC