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VND5050AKTR-E Datasheet(PDF) 16 Page - STMicroelectronics |
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VND5050AKTR-E Datasheet(HTML) 16 Page - STMicroelectronics |
16 / 38 page Electrical specifications VND5050AJ-E / VND5050AK-E 16/38 Table 11. Electrical transient requirements ISO 7637-2: 2004(E) Test pulse Test levels (1) Number of pulses or test times Burst cycle/pulse repetition time Delays and impedance III IV 1 -75V -100V 5000 pulses 0.5 s 5 s 2 ms, 10 Ω 2a +37V +50V 5000 pulses 0.2 s 5 s 50 µs, 2 Ω 3a -100V -150V 1h 90 ms 100 ms 0.1 µs, 50 Ω 3b +75V +100V 1h 90 ms 100 ms 0.1 µs, 50 Ω 4-6V -7V 1 pulse 100 ms, 0.01 Ω 5b (2) +65V +87V 1 pulse 400 ms, 2 Ω ISO 7637-2: 2004(E) Test pulse Test level results(1) 1. The above test levels must be considered referred to VCC = 13.5V except for pulse 5b. III IV 1C C 2a C C 3a C C 3b C C 4C C 5b (2) 2. Valid in case of external load dump clamp: 40V maximum referred to ground. CC Class Contents C All functions of the device are performed as designed after exposure to disturbance. E One or more functions of the device are not performed as designed after exposure to disturbance and cannot be returned to proper operation without replacing the device. |
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