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5962-9222101M3A Datasheet(PDF) 1 Page - Texas Instruments |
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5962-9222101M3A Datasheet(HTML) 1 Page - Texas Instruments |
1 / 12 page CY54FCT543T, CY74FCT543T 8-BIT LATCHED REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS SCCS030A – MAY 1994 – REVISED OCTOBER 2001 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Function, Pinout, and Drive Compatible With FCT and F Logic D Reduced VOH (Typically = 3.3 V) Versions of Equivalent FCT Functions D Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics D Ioff Supports Partial-Power-Down Mode Operation D Matched Rise and Fall Times D Fully Compatible With TTL Input and Output Logic Levels D 3-State Outputs D ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) D Separation Controls for Data Flow in Each Direction D Back-to-Back Latches for Storage D CY54FCT543T – 48-mA Output Sink Current – 12-mA Output Source Current D CY74FCT543T – 64-mA Output Sink Current – 32-mA Output Source Current description The ’FCT543T octal latched transceivers contain two sets of eight D-type latches with separate latch-enable (LEAB, LEBA) and output-enable (OEAB, OEBA) inputs for each set to permit independent control of input and output in either direction of data flow. For data flow from A to B, for example, the A-to-B enable (CEAB) input must be low in order to enter data from A or to take data from B, as indicated in the function table. With CEAB low, a low signal on the A-to-B latch-enable (LEAB) input makes the A-to-B latches transparent; a subsequent low-to-high transition of the LEAB signal puts the A latches in the storage mode and their outputs no longer change with the A inputs. With CEAB and OEAB low, the 3-state B-output buffers are active and reflect the data present at the output of the A latches. Control of data from B to A is similar, but uses CEBA, LEBA, and OEBA inputs. These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. Copyright 2001, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 LEBA OEBA A0 A1 A2 A3 A4 A5 A6 A7 CEAB GND VCC CEBA B0 B1 B2 B3 B4 B5 B6 B7 LEAB OEAB CY54FCT543T ...D PACKAGE CY74FCT543T ...Q OR SO PACKAGE (TOP VIEW) On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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