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ST24C16 Datasheet(PDF) 2 Page - STMicroelectronics

Part No. ST24C16
Description  16 Kbit Serial I2C Bus EEPROM with User-Defined Block Write Protection
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Maker  STMICROELECTRONICS [STMicroelectronics]
Homepage  http://www.st.com
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ST24C16 Datasheet(HTML) 2 Page - STMicroelectronics

 
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SDA
VSS
SCL
MODE/WC
PB0
PRE
VCC
PB1
AI00867B
ST24x16
ST25x16
1
2
3
4
8
7
6
5
Figure 2A. DIP Pin Connections
1
AI00500B
2
3
4
8
7
6
5
SDA
VSS
SCL
MODE/WC
PB0
PRE
VCC
PB1
ST24x16
ST25x16
Figure 2B. SO8 Pin Connections
ance of one million erase/write cycles with a data
retention of 40 years. The ST25x16 operates with
a power supply value as low as 2.5V. Both Plastic
Dual-in-Line and Plastic Small Outline packages
are available.
The memories are compatible with the I2C stand-
ard, two wire serial interface which uses a bi-direc-
tional data bus and serial clock. The memories
DESCRIPTION (cont’d)
carry a built-in 4 bit, unique device identification
code (1010) corresponding to the I2C bus defini-
tion. The memories behave as slave devices in the
I2C protocol with all memory operations synchro-
nized by the serial clock. Read and write operations
are initiated by a START condition generated by the
bus master. The START condition is followed by a
stream of 4 bits (identification code 1010), 3 block
select bits, plus one read/write bit and terminated
by an acknowledge bit. When writing data to the
Symbol
Parameter
Value
Unit
TA
Ambient Operating Temperature
–40 to 125
°C
TSTG
Storage Temperature
–65 to 150
°C
TLEAD
Lead Temperature, Soldering
(SO8)
(PSDIP8)
40 sec
10 sec
215
260
°C
VIO
Input or Output Voltages
–0.6 to 6.5
V
VCC
Supply Voltage
–0.3 to 6.5
V
VESD
Electrostatic Discharge Voltage (Human Body model)
(2)
4000
V
Electrostatic Discharge Voltage (Machine model)
(3)
500
V
Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings"
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and
other relevant quality documents.
2. 100pF through 1500
Ω; MIL-STD-883C, 3015.7
3. 200pF through 0
Ω; EIAJ IC-121 (condition C)
Table 2. Absolute Maximum Ratings
(1)
2/17
ST24/25C16, ST24/25W16


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