Specifications ispLSI 3192

5

Switching Test Conditions

Input Pulse Levels

Table 2 - 0003

Input Rise and Fall Time

Input Timing Reference Levels

Output Timing Reference Levels

Output Load

GND to 3.0V

≤ 3ns 10% to 90%

1.5V

1.5V

See figure 2

3-state levels are measured 0.5V from steady-state

active level.

Output Load conditions (See figure 2)

TEST CONDITION

R1

R2

CL

A

470Ω

390Ω

35pF

B

∞

390Ω

35pF

470Ω

390Ω

35pF

Active High

Active Low

C

470Ω

390Ω

5pF

∞

390Ω

5pF

Active Low to Z

at V +0.5V

OL

Active High to Z

at V

-0.5V

OH

Table 2 - 0004A

Figure 2. Test Load

+ 5V

R1

R2

Device

Output

Test

Point

0213A

DC Electrical Characteristics

Over Recommended Operating Conditions

SYMBOL

1. One output at a time for a maximum duration of one second. V

= 0.5V was selected to avoid test problems

by tester ground degradation. Characterized but not 100% tested.

2. Measured using twelve 16-bit counters.

section of this datasheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate

Table 2 - 0007isp/3192

1

PARAMETER

2,4

Output Low Voltage

Output High Voltage

Input or I/O High Leakage Current

Input or I/O Low Leakage Current

Bscan/ispEN Input Low Leakage Current

I/O Active Pull-Up Current

Output Short Circuit Current

Operating Power Supply Current

I = 8 mA

I

= -4 mA

3.5V ≤ V ≤ V

0V ≤ V ≤ V (Max.)

0V ≤ V ≤ V

0V ≤ V ≤ V

V = 5V, V

= 0.5V

V = 0.0V, V = 3.0V

f

= 1 MHz

OL

OH

IN

IL

IN

CC

IN

IL

IN

IL

CC

OUT

TOGGLE

IL

IH

CONDITION

MIN.

TYP.

MAX.

UNITS

3

–

2.4

–

–

–

–

–

–

–

–

–

–

–

–

–

320

0.4

–

10

-10

-150

-150

-200

V

V

µA

µA

µA

µA

mA

mA

OUT

–

–

320

mA

–

Commercial

Industrial