Electronic Components Datasheet Search |
|
SNJ54LVTH18502AHV Datasheet(PDF) 9 Page - Texas Instruments |
|
|
SNJ54LVTH18502AHV Datasheet(HTML) 9 Page - Texas Instruments |
9 / 40 page SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A 3.3V ABT SCAN TEST DEVICES WITH 18BIT UNIVERSAL BUS TRANSCEIVERS SCBS668C − JULY 1996 − REVISED JUNE 2004 9 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 register overview With the exception of the bypass and device-identification registers, any test register can be thought of as a serial shift register with a shadow latch on each bit. The bypass and device-identification registers differ in that they contain only a shift register. During the appropriate capture state (Capture-IR for instruction register, Capture-DR for data registers), the shift register can be parallel loaded from a source specified by the current instruction. During the appropriate shift state (Shift-IR or Shift-DR), the contents of the shift register are shifted out from TDO, while new contents are shifted in at TDI. During the appropriate update state (Update-IR or Update-DR), the shadow latches are updated from the shift register. instruction register description The instruction register (IR) is eight bits long and tells the device what instruction is to be executed. Information contained in the instruction includes the mode of operation (either normal mode, in which the device performs its normal logic function, or test mode, in which the normal logic function is inhibited or altered), the test operation to be performed, which of the four data registers is to be selected for inclusion in the scan path during data-register scans, and the source of data to be captured into the selected data register during Capture-DR. Table 3 lists the instructions supported by the ’LVTH18502A and ’LVTH182502A. The even-parity feature specified for SCOPE devices is supported in this device. Bit 7 of the instruction opcode is the parity bit. Any instructions that are defined for SCOPE devices, but are not supported by this device, default to BYPASS. During Capture-IR, the IR captures the binary value 10000001. As an instruction is shifted in, this value is shifted out via TDO and can be inspected as verification that the IR is in the scan path. During Update-IR, the value that has been shifted into the IR is loaded into shadow latches. At this time, the current instruction is updated and any specified mode change takes effect. At power up or in the Test-Logic-Reset state, the IR is reset to the binary value 10000001, which selects the IDCODE instruction. The IR order of scan is shown in Figure 2. Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 TDO TDI Bit 7 Parity (MSB) Bit 0 (LSB) Figure 2. Instruction Register Order of Scan |
Similar Part No. - SNJ54LVTH18502AHV |
|
Similar Description - SNJ54LVTH18502AHV |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.COM |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Datasheet Upload | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |