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ADS5545 Datasheet(PDF) 8 Page - Texas Instruments

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Part # ADS5545
Description  11-BIT, 200 MSPS ADC
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

ADS5545 Datasheet(HTML) 8 Page - Texas Instruments

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ADS5517
SLWS203 – DECEMBER 2007
TIMING CHARACTERISTICS – LVDS AND CMOS MODES (continued)
For timings at lower sampling frequencies, see the Output Timing section in the APPLICATION INFORMATION of this data
sheet.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Input clock rising edge zero-cross to output
tPDI
Clock propagation delay(7)
3.7
4.4
5.1
ns
clock rising edge zero-cross
Duty cycle of differential clock,
LVDS bit clock duty cycle
(CLKOUTP-CLKOUTM)
45%
50%
55%
80
≤ Fs ≤ 200 MSPS
Rise time measured from –50 mV to 50
tr ,
Data rise time,
mV
50
100
200
ps
tf
Data fall time
Fall time measured from 50 mV to –50 mV
1
≤ Fs ≤ 200 MSPS
Rise time measured from –50 mV to 50
tCLKRISE,
Output clock rise time,
mV
50
100
200
ps
tCLKFALL
Output clock fall time
Fall time measured from 50 mV to –50 mV
1
≤ Fs ≤ 200 MSPS
Output clock jitter
Cycle-to-cycle jitter
120
ps pp
Output enable (OE) to valid data
Time to valid data after OE becomes
tOE
1
µs
delay
active
PARALLEL CMOS MODE
Data valid(8) to 50% of CLKOUT rising
ns
tsu
Data setup time (5)
1.8
2.6
edge
50% of CLKOUT rising edge to data
th
Data hold time (5)
0.4
0.8
ns
becoming invalid(8)
Input clock rising edge zero-cross to 50%
tPDI
Clock propagation delay(7)
2.6
3.4
4.2
ns
of CLKOUT rising edge
Duty cycle of output clock (CLKOUT)
Output clock duty cycle
45%
80
≤ Fs ≤ 200 MSPS
Rise time measured from 20% to 80% of
DRVDD
tr ,
Data rise time,
Fall time measured from 80% to 20% of
0.8
1.5
2.0
ns
tf
Data fall time
DRVDD
1
≤ Fs ≤ 200 MSPS
Rise time measured from 20% to 80% of
DRVDD
tCLKRISE,
Output clock rise time,
Fall time measured from 80% to 20% of
0.4
0.8
1.2
ns
tCLKFALL
Output clock fall time
DRVDD
1
≤ Fs ≤ 200 MSPS
Output enable (OE) to valid data
Time to valid data after OE becomes
tOE
50
ns
delay
active
(7)
To use the input clock as the data capture clock, it is necessary to delay the input clock by a delay (tD) to get the desired setup and hold
times. Use either of these equations to calculate tD:
Desired setup time = tD - (tPDI - tsu )
Desired hold time = (tPDI + th ) - tD
(8)
Data valid refers to logic high of 2 V and logic low of 0.8 V
8
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Copyright © 2007, Texas Instruments Incorporated
Product Folder Link(s): ADS5517


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