M29W800AT datasheet(13/33 Pages) STMICROELECTRONICS | 8 Mbit 1Mb x8 or 512Kb x16, Boot Block Low Voltage Single Supply Flash Memory

Part No.	M29W800AT

Description	8 Mbit 1Mb x8 or 512Kb x16, Boot Block Low Voltage Single Supply Flash Memory

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Manufacturer	STMICROELECTRONICS [STMicroelectronics]

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M29W800AT, M29W800AB

Figure 5. AC Testing Input Output Waveform

AI01417

3V

0V

1.5V

Figure 6. AC Testing Load Circuit

AI01968

0.8V

OUT

CL = 30pF or 100pF

CL includes JIG capacitance

3.3k

Ω

1N914

DEVICE

UNDER

TEST

Table 13. Capacitance (1) (TA =25 °C, f = 1 MHz)

Note: Sampled only, not 100% tested.

Table 14. DC Characteristics

(TA = 0 to 70°C, –20 to 85°C or –40 to 85°C; VCC = 2.7V to 3.6V)

Note: 1. Sampled only, not 100% tested.

Symbol

Parameter

Test Condition

Min

Max

Unit

CIN

Input Capacitance

VIN =0V

6pF

COUT

Output Capacitance

VOUT =0V

12

pF

Symbol

Parameter

Test Condition

Min

Typ.

Max

Unit

ILI

Input Leakage Current

0V

≤ VIN ≤ VCC

±1

µA

ILO

Output Leakage Current

0V

≤ VOUT ≤ VCC

±1

µA

ICC1

Supply Current (Read by Word)

E= VIL,G = VIH,f = 6MHz

310

mA

ICC2

Supply Current (Read by Word)

E= VIL,G = VIL, f = 6MHz

4.5

10

mA

ICC3

Supply Current (Stan-by)

E = VCC ±0.2V

30

100

µA

ICC4

(1)

Supply Current

(Program or Erase)

Byte program, Block or

Chip Erase in progress

20

mA

VIL

Input Low Voltage

–0.5

0.8

V

VIH

Input High Voltage

0.7 VCC

VCC + 0.3

V

VOL

Output Low Voltage

IOL = 1.8mA

0.45

V

VOH

Output High Voltage CMOS

IOH = –100µAVCC –0.4V

V

VID

A9 Voltage (Electronic Signature)

11.5

12.5

V

IID

A9 Current (Electronic Signature)

A9 = VID

30

100

µA

VLKO

(1)

Supply Voltage (Erase and

Program lock-out)

2.0

2.3

V

Table 12. AC Measurement Conditions

Input Rise and Fall Times

≤10ns

Input Pulse Voltages

0 to 3V

Input and Output Timing Ref. Voltages

1.5V

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