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MFRC522 Datasheet(PDF) 77 Page - NXP Semiconductors

Part No. MFRC522
Description  Contactless Reader IC
Download  109 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

MFRC522 Datasheet(HTML) 77 Page - NXP Semiconductors

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© NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 3.2 — 22 May 2007
77 of 109
NXP Semiconductors
MFRC522
Contactless Reader IC
19.3 Testsignals at pin AUX
With the MFRC522, the user may select internal signals to measure them at pin AUX.
These measurements can be helpful during the design-in phase to optimise the design or
for test purpose.
Table 154 shows an overview of the signal that can be switched to pin AUX1 or AUX2 by
setting SelAux1 or SelAux2 in the register AnalogTestReg.
Please also refer to register AnalogSelAux.
Remark: The DAC has a current output. It is recommended to use a 1 k
Ω pull-down
resistance at pins AUX1/AUX2.
Table 151: Description of Testsignals
Pins
Testsignal
Description
D6
sdata
shows the actual received data stream.
D5
scoll
shows if in the actual bit a collision has been detected (106 kbit/s only)
D4
svalid
shows if sdata and scoll are valid
D3
sover
shows that the receiver has detected a stop condition
D2
RCV_reset
shows if the receiver is reset
D1
-
reserved
Table 152: TestSel2Reg register (address 0Dh)
Pins
D6
D5
D4
D3
D2
D1
Testsignal
clkstable
clk27/8
-
-
clk27
-
Table 153: Description of Testsignals
Pins
Testsignal
Description
D6
clkstable
shows if the oscillator delivers a stable signal.
D5
clk27/8
shows the output signal of the oscillator divided by 8
D4 to D3
-
reserved
D2
clk27
shows the output signal of the oscillator
D1
-
reserved
Table 154: Testsignals description
SelAux
Description for Aux1 / Aux2
0000
Tristate
0001
DAC: register TestDAC 1/2
0010
DAC: testsignal corr1
0011
Reserved
0100
DAC: testsignal MinLevel
0101
DAC: ADC_I
0110
DAC: ADC_Q
0111 - 1001
Reserved
1010
High
1011
low


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