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CY23FS08-04
Document Number: 001-17042 Rev. **
Page 9 of 11
Table 6. Switching Characteristics for FailSafe Industrial Temperature Devices
Parameter [5]
Description
Test Conditions
Min
Typ
Max
Unit
fREF
Reference Frequency
Industrial Grade
1.0
–
4.1
MHz
fOUT
Output Frequency
15 pF Load
1.0
–
133
MHz
fXIN
DCXO Frequency
15
–
25
MHz
tDC
Duty Cycle
Measured at VDD/2
40
–
60
%
tSR(I)
Input Slew Rate
Measured on REF1 Input, 30% to 70% of VDD
0.5
–
4.0
V/ns
tSR(O)
Output Slew Rate
Measured from 20% to 80% of VDD = 1.8V, 15 pF Load
0.3
–
3.0
V/ns
tSK(O)
Output to Output Skew
All outputs equally loaded, measured at VDD/2
–
110
200
ps
tSK(IB)
Intrabank Skew
All outputs equally loaded, measured at VDD/2
–
–
75
ps
t(φ)
[4]
Static Phase Offset
Measured at VDD/2
–
–
250
ps
tD(φ)
[4]
Dynamic Phase Offset
Measured at VDD/2
–
150
200
ps
tJ(CC)
Cycle-to-Cycle Jitter
Load = 15 pF, fOUT ≥ 6.25 MHz
–
200
250
ps
–18
46
psRMS
Table 7. Pullable Crystal Specifications
Parameter
Description
Min
Typ
Max
Unit
CR load
Crystal Load Capacitance
16
pF
C0 / C1
C0 / C1 Ratio
240
ESR
Equivalent Series Resistance
50
Ω
Notes
4. The
t(φ) reference feedback input delay is guaranteed for a maximum 4:1 input edge ratio between the two signals as long as tSR(I) is maintained.
5. Parameters are guaranteed by design and characterization. Not 100% tested in production.
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