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SCAN921025H Datasheet(PDF) 8 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Part # SCAN921025H
Description  High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

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Deserializer Switching Characteristics (Continued)
Over recommended operating supply and temperature ranges unless otherwise specified.
Symbol
Parameter
Conditions
Pin/Freq.
Min
Typ
Max
Units
t
HZR
HIGH to TRI-STATE
Delay
Figure 14
Rout(0-9)
2.8
10
ns
t
LZR
LOW to TRI-STATE
Delay
2.8
10
ns
t
ZHR
TRI-STATE to HIGH
Delay
4.2
10
ns
t
ZLR
TRI-STATE to LOW
Delay
4.2
10
ns
t
DSR1
Deserializer PLL Lock
Time from PWRDWN
(with SYNCPAT)
Figure 15
Figure 16
(Note 7)
20MHz
1.7
3.5
µs
80MHz
1.0
2.5
µs
t
DSR2
Deserializer PLL Lock
time from SYNCPAT
20MHz
0.65
1.5
µs
80MHz
0.29
0.8
µs
t
ZHLK
TRI-STATE to HIGH
Delay (power-up)
LOCK
3.7
12
ns
t
RNMI-R Ideal Noise Margin
Right
Figure 20
VCC = 3.15 to 3.6V
80MHz
+335
ps
VCC = 3.0V
+215
20MHz
+1
ns
t
RNMI-L
Ideal Noise Margin Left
Figure 20
VCC = 3.15 to 3.6V
80MHz
-395
ps
VCC = 3.0V
-520
20MHz
-1
ns
SCAN Circuitry Timing Requirements
Symbol
Parameter
Conditions
Min
Typ
Max
Units
f
MAX
Maximum TCK Clock
Frequency
R
L = 500
Ω,C
L = 35 pF
25.0
50.0
MHz
t
S
TDI to TCK, H or L
1.0
ns
t
H
TDI to TCK, H or L
2.0
ns
t
S
TMS to TCK, H or L
2.5
ns
t
H
TMS to TCK, H or L
1.5
ns
t
W
TCK Pulse Width, H or L
10.0
ns
t
W
TRST Pulse Width, L
2.5
ns
t
REC
Recovery Time, TRST to
TCK
2.0
ns
Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices
should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation.
Note 2: Typical values are given for VCC = 3.3V and TA = +25˚C.
Note 3: Current into device pins is defined as positive. Current out of device pins is defined as negative. Voltages are referenced to ground except VOD,
∆VOD,
VTH and VTL which are differential voltages.
Note 4: tLLHT and tLHLT specifications are Guaranteed By Design (GBD) using statistical analysis.
Note 5: Because the Serializer is in TRI-STATE mode, the Deserializer will lose PLL lock and have to resynchronize before data transfer.
Note 6: tDJIT specifications are Guaranteed By Design using statistical analysis.
Note 7: For the purpose of specifying deserializer PLL performance, tDSR1 and tDSR2 are specified with the REFCLK running and stable, and with specific
conditions for the incoming data stream (SYNCPATs). It is recommended that the derserializer be initialized using either tDSR1 timing or tDSR2 timing. tDSR1 is the
time required for the deserializer to indicate lock upon power-up or when leaving the power-down mode. Synchronization patterns should be sent to the device before
initiating either condition. tDSR2 is the time required to indicate lock for the powered-up and enabled deserializer when the input (RI+ and RI-) conditions change from
not receiving data to receiving synchronization patterns (SYNCPATs).
Note 8: tRNM is a measure of how much phase noise (jitter) the deserializer can tolerate in the incoming data stream before bit errors occur. The Deserializer Noise
Margin is Guaranteed By Design (GBD) using statistical analysis.
www.national.com
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