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DS36C200IMT Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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DS36C200IMT Datasheet(HTML) 4 Page - National Semiconductor (TI) |
4 / 11 page Electrical Characteristics (Notes 2, 3, 7) (Continued) EIAJ (0 Ω, 200 pF) ≥ 300V Note 5: CL includes probe and fixture capacitance. Note 6: Generator waveform for all tests unless otherwise specified:f=1 MHz, ZO =50Ω,tr ≤ 1 ns, tf ≤ 1 ns (0%–100%). Note 7: The DS36C200I is a current mode device and will meet the datasheet specifications only with a resistive load applied to the driver outputs. Note 8: Package Thermal Resistance Ratings are for 2-Layer, 2 ounce Cu, FR-14, printed circuit board, tested per JEDEC. Switching Characteristics Over supply voltage and operating temperature ranges, unless otherwise specified. (Notes 5, 6) Symbol Parameter Conditions Min Typ Max Units DIFFERENTIAL DRIVER CHARACTERISTICS t PHLD Differential Propagation Delay High to Low R L =55 Ω,C L =10pF (Figure 2 and Figure 3) 1.0 2.5 5.5 ns t PLHD Differential Propagation Delay Low to High 1.0 2.6 5.5 ns t SKD Differential Skew |t PHLD –tPLHD| 0 0.1 2 ns t TLH Transition Time Low to High 0 0.5 2 ns t THL Transition Time High to Low 0 0.5 2 ns t PHZ Disable Time High to Z R L =55 Ω (Figure 4 and Figure 5) 0.3 5 20 ns t PLZ Disable Time Low to Z 0.3 5 20 ns t PZH Enable Time Z to High 0.3 10 30 ns t PZL Enable Time Z to Low 0.3 10 30 ns DIFFERENTIAL RECEIVER CHARACTERISTICS t PHLD Differential Propagation Delay High to Low C L = 10 pF, VID = 200 mV (Figure 6 and Figure 7) 1.5 5 10 ns t PLHD Differential Propagation Delay Low to High 1.5 4.6 10 ns t SKD Differential Skew |t PHLD –tPLHD| 0 0.4 3 ns t r Rise Time 0 1.5 7 ns t f Fall Time 0 1.5 7 ns t PHZ Disable Time High to Z C L =10pF (Figure 8 and Figure 9) 1 5 20 ns t PLZ Disable Time Low to Z 1 5 20 ns t PZH Enable Time Z to High 0.3 10 30 ns t PZL Enable Time Z to Low 0.3 10 30 ns Parameter Measurement Information 20077603 FIGURE 1. Differential Driver DC Test Circuit 20077604 FIGURE 2. Differential Driver Propagation Delay and Transition Time Test Circuit www.national.com 4 |
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