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OPA2652E250G4 Datasheet(PDF) 2 Page - Burr-Brown (TI) |
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OPA2652E250G4 Datasheet(HTML) 2 Page - Burr-Brown (TI) |
2 / 20 page www.ti.com ABSOLUTE MAXIMUM RATINGS 1 2 3 4 8 7 6 5 +V S OutB - InB +InB OutA - InA +InA - V S OPA2652 C52 Pin1 TopView SO-8 SOT23-8 SOT23-8Marking/PinOrientation OPA2652 SBOS125A – JUNE 2000 – REVISED MAY 2006 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) SPECIFIED PACKAGE- PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT MEDIA, PRODUCT LEAD DESIGNATOR RANGE MARKING NUMBER QUANTITY OPA2652U Rails OPA2652U SO-8 D –40 °C to +85°C OPA2652U OPA2652U/2K5 Tape and Reel, 2500 OPA2652E/250 Tape and Reel, 250 OPA2652E SOT23-8 DCN –40 °C to +85°C C52 OPA2652E/3K Tape and Reel, 3000 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. over operating free-air temperature range (unless otherwise noted)(1) OPA2652 UNIT Supply voltage ±6.5 V Internal power dissipation See Thermal Characteristics Differential input voltage ±1.2 V Input voltage range ±V S V Storage temperature range –40 to +125 °C Lead temperature (SO-8) +260 °C Junction temperature, TJ +175 °C ESD rating: Human body model 2000 V Machine model 200 V (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. PIN CONFIGURATION 2 Submit Documentation Feedback |
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