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TLP115A Datasheet(PDF) 5 Page - Toshiba Semiconductor |
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TLP115A Datasheet(HTML) 5 Page - Toshiba Semiconductor |
5 / 8 page TLP115A 2007-10-01 5 Test Circuit 1: Switching Time Test Circuit CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 2: Common Mode Transient Immunity Test Circuit s) ( f t (V) 320 L CM s) ( r t (V) 320 H CM μ = , μ = CL is approximately 15pF which includes probe and stray wiring capacitance. GND VCC Output monitor VC CL IF VCC = 5V Pulse input PW = 100μs Duty ratio = 1 / 10 IF monitor VO IF 7.5mA 3.75mA 0mA 5V 4.5V 1.5V 0.5V VOL tr tf tpLH tpHL GND VCC Output monitor VO CL IF VCC = 5V VO VCM Pulse generator ZO = 50Ω 400V 0V 90% 5V 2V 0.8V VOL tf VCM 10% VO (IF = 10mA) (IF = 0mA) tr |
Similar Part No. - TLP115A_07 |
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Similar Description - TLP115A_07 |
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