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TC74LVX74F Datasheet(PDF) 2 Page - Toshiba Semiconductor

Part # TC74LVX74F
Description  Dual D-Type Flip-Flop with Preset and Clear
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Manufacturer  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TC74LVX74F Datasheet(HTML) 2 Page - Toshiba Semiconductor

  TC74LVX74F_07 Datasheet HTML 1Page - Toshiba Semiconductor TC74LVX74F_07 Datasheet HTML 2Page - Toshiba Semiconductor TC74LVX74F_07 Datasheet HTML 3Page - Toshiba Semiconductor TC74LVX74F_07 Datasheet HTML 4Page - Toshiba Semiconductor TC74LVX74F_07 Datasheet HTML 5Page - Toshiba Semiconductor TC74LVX74F_07 Datasheet HTML 6Page - Toshiba Semiconductor TC74LVX74F_07 Datasheet HTML 7Page - Toshiba Semiconductor TC74LVX74F_07 Datasheet HTML 8Page - Toshiba Semiconductor  
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TC74LVX74F/FN/FT
2007-10-17
2
Pin Assignment (top view)
IEC Logic Symbol
Truth Table
Inputs
Outputs
CLR
PR
D
CK
Q
Q
Function
L
H
X
X
L
H
Clear
H
L
X
X
H
L
Preset
L
L
X
X
H
H
H
H
L
L
H
H
H
H
H
L
H
H
X
Qn
Q n
No change
X: Don’t care
Absolute Maximum Ratings (Note)
Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
−0.5 to 7.0
V
DC input voltage
VIN
−0.5 to 7.0
V
DC output voltage
VOUT
−0.5 to VCC + 0.5
V
Input diode current
IIK
−20
mA
Output diode current
IOK
±20
mA
DC output current
IOUT
±25
mA
DC VCC/ground current
ICC
±50
mA
Power dissipation
PD
180
mW
Storage temperature
Tstg
−65 to 150
°C
Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
VCC
CLR
2
2D
2CK
PR
2
2Q
14
13
12
11
10
CLR
1
1
2
3
4
5
6
7
1D
1CK
PR
1
1Q
Q
1
GND
Q
2
9
8
CK
Q
D
Q
CK
Q
D
Q
1Q
Q
1
2Q
Q
2
(5)
(6)
(9)
(8)
(3)
(1)
(11)
(13)
(4)
(2)
(10)
(12)
PR
1
1D
PR
2
2D
1CK
CLR
1
2CK
CLR
2
S
C1
1D
R


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