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TA1360ANG Datasheet(PDF) 96 Page - Toshiba Semiconductor |
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TA1360ANG Datasheet(HTML) 96 Page - Toshiba Semiconductor |
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96 / 108 page  TA1360ANG 2005-08-18 96 Note Characteristics Test Conditions HA05 HD input threshold amplitude 1. Set subaddress (00) data to 40H. 2. Input signal B (as shown in the figure below) to TP 16. 3. Increase signal B amplitude from 0 Vp-p. When #26 (H-OUT) phase locks with that of signal B, measure signal B amplitude VthHD. HA06 Horizontal picture phase adjustment variable range 1. Set subaddress (00) data to 40H. 2. Input signal B (the figure is shown below) to TP16. 3. Change subaddress (01) data from 80H to 00H, and measure phase change amount ∆HSFT− of #24 (H-OUT) waveform. 4. Change slave address (01) data from 80H to FEH, and measure phase change amount ∆HSFT+ of #24 (H-OUT) waveform. 31.75 µs VthDH 2.35 µs Signal B 31.75 µs 1.5 V 2.35 µs Signal B #24 waveform Data: 00H ∆HSFT− ∆HSFT+ #24 waveform Data: FEH #24 waveform Data: 80H |
Similar Part No. - TA1360ANG_05 |
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Similar Description - TA1360ANG_05 |
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