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TLP251 Datasheet(PDF) 4 Page - Toshiba Semiconductor |
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TLP251 Datasheet(HTML) 4 Page - Toshiba Semiconductor |
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4 / 7 page  TLP251 2007-10-01 4 Switching Characteristics (Ta = −20~70°C, unless otherwise specified) Characteristic Symbol Test Cir − cuit Test Condition Min. Typ.* Max. Unit L→H tpLH ― 0.25 1.0 Propagation delay time H→L tpHL ― 0.25 1.0 Output rise time tr ― ― ― Output fall time tf 5 IF = 8mA VCC1 = +15V, VEE1 = −15V RL = 200 Ω ― ― ― μs Common mode transient immunity at high level output CMH VCM = 600V, IF = 8mA, VCC = 30V, Ta = 25℃ −5000 ― ― V / μs Common mode transient immunity at low level output CML 6 VCM = 600V, IF = 0mA, VCC = 30V, Ta = 25℃ 5000 ― ― V / μs *All typical values are at Ta=25℃ Test Circuit 1 : IOPH Test Circuit 2 : IOPL Test Circuit 3 : VOH Test Circuit 4 : VOL 8 1 4 VCC1 0.1μF VOL VF RL VEE1 V 8 1 4 VCC 0.1μF IOPL A V6-5 8 1 4 VCC1 0.1μF VOH V IF RL VEE1 8 1 4 VCC 0.1μF IOPH V8-6 IF A |
Similar Part No. - TLP251_07 |
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Similar Description - TLP251_07 |
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