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CF5707CG Datasheet(PDF) 6 Page - Nippon Precision Circuits Inc |
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CF5707CG Datasheet(HTML) 6 Page - Nippon Precision Circuits Inc |
6 / 7 page CF5707CG SEIKO NPC CORPORATION —6 Test Function Normal mode (TEST = open) A 512Hz rectangular waveform is output on the TEST pin. Note that the load resistance is 10M Ω or greater and capacitance is 20pF or less. Normal watch movement waveforms are output on OUT1 and OUT2. Test mode 1 (TEST = VDD) The device switches to test mode 1 when the TEST pin goes HIGH (VDD). Note, however, that the TEST must stay HIGH for 2 cycles of the 512Hz clock (TCH > 3.9ms), otherwise the input is ignored. In test mode 1, high- speed watch movement period (TCY = 62.5ms) is selected. Test mode 2 (TEST = VSS) (Note. IC test mode only) The device switches to test mode 2 when the TEST pin goes LOW (VSS). In test mode 2, operation occurs at 32-times speed. Furthermore, if an input on RESET occurs, all internal registers are cleared and circuit opera- tion stops. Once in this condition, the circuit remains stopped until the TEST pin becomes open circuit or HIGH level (VDD). Test mode 1 OUT1 OUT2 TPW TCY/2 VDD VSS TPW TCY/2 VDD VSS tCY/2 tCY/2 TPW T < Tch T > Tch VDD VSS TEST |
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