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ADS62P15 Datasheet(PDF) 5 Page - Texas Instruments

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Part No. ADS62P15
Description  Dual Channel 11-Bits, 125 MSPS ADC With Parallel CMOS/DDR LVDS Outputs
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Maker  TI [Texas Instruments]
Homepage  http://www.ti.com
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ADS62P15 Datasheet(HTML) 5 Page - Texas Instruments

 
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ELECTRICAL CHARACTERISTICS
ADS62P15
SLAS572 – OCTOBER 2007
Typical values at 25
°C, min and max values are across the full temperature range T
MIN = –40°C to TMAX = 85°C, AVDD =
3.3V, DRVDD = 1.8V to 3.3V, sampling frequency = 125 MSPS, 50% clock duty cycle, –1dBFS differential analog input,
internal reference mode, applies to CMOS and LVDS interfaces (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
11
bits
ANALOG INPUTS
Differential input voltage range
2
VPP
Differential input resistance (at dc)
See Figure 31
> 1
M
Differential input capacitance
See Figure 32
7
pF
Analog input bandwidth
450
MHz
Analog input common mode current (per input pin)
125
µA
VCM common mode voltage output
1.5
V
VCM output current capability
4
mA
POWER SUPPLY
Analog supply current (AVDD)
216
ISS
mA
Output buffer supply current (DRVDD)
DRVDD=1.8V, 2.5 MHz input signal
17
CMOS interface
no load capacitance(1)
Total power – CMOS interface
0.74
W
Total power – CMOS interface
DRVDD=3.3V, 50MHz input signal
1.225
W
10pF load capacitance
Total power – LVDS interface
DRVDD = 3.3V
0.94
W
Global power down
30
60
mW
DC ACCURACY
No missing codes
Specifie
d
DNL
Differential Non-Linearity
-0.8
±0.4
0.8
LSB
INL
Integral Non-Linearity
-3.5
±1
3.5
LSB
EO
Offset Error
-10
±3
10
mV
Offset error temperature coefficient
0.05
mV/
°C
There are two sources of gain error – internal reference inaccuracy and channel gain error
Gain error due to internal reference inaccuracy
EGREF
-1
±0.25
1
%FS
alone
EGCHAN
Gain error of channel alone(2)
-1
±0.3
1
%FS
Channel gain error temperature coefficient
0.005
Δ%/
°C
(1)
In CMOS mode, the DRVDD current scales with the sampling frequency and the load capacitance on output pins (see Figure 28).
(2)
This is specified by design and characterization; it is not tested in production.
Copyright © 2007, Texas Instruments Incorporated
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