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SN54ALS86 Datasheet(PDF) 1 Page - Texas Instruments

Part No. SN54ALS86
Description  QUADRUPLE 2-INPUT EXCLUSIVE-OR GATES
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

SN54ALS86 Datasheet(HTML) 1 Page - Texas Instruments

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SN54ALS86, SN54AS86A, SN74ALS86, SN74AS86A
QUADRUPLE 2INPUT EXCLUSIVEOR GATES
SDAS006B − APRIL 1982 − REVISED DECEMBER 1994
Copyright
1994, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251−1443
Package Options Include Plastic
Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These devices contain four independent 2-input
exclusive-OR gates. They perform the Boolean
functions Y = A
⊕ B or Y = AB + AB in positive
logic.
A common application is as a true/complement
element. If one of the inputs is low, the other input
is reproduced in true form at the output. If one of
the inputs is high, the signal on the other input is
reproduced inverted at the output.
The
SN54ALS86
and
SN54AS86A
are
characterized for operation over the full military
temperature range of − 55
°C to 125°C. The
SN74ALS86 and SN74AS86A are characterized
for operation from 0
°C to 70°C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
OUTPUT
Y
L
L
L
L
HH
H
LH
H
H
L
logic symbol
1
1A
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
1Y
3
2Y
6
3Y
8
4Y
11
= 1
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
SN54ALS86, SN54AS86A ...J PACKAGE
SN74ALS86, SN74AS86A ...D OR N PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
SN54ALS86, SN54AS86A . . . FK PACKAGE
(TOP VIEW)
32
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
NC − No internal connection
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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