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R1131D251A Datasheet(PDF) 7 Page - RICOH electronics devices division |
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R1131D251A Datasheet(HTML) 7 Page - RICOH electronics devices division |
7 / 30 page R1131x 7 TEST CIRCUIT ∗ C1=C2=Tantalum VOUT <1.0V) C1 =C2=Ceramic1.0µF (VOUT > = 1.0V) VDD GND OUT C1 C2 V IOUT VOUT CE ⋅ CE R1131x Series VDD GND OUT R1131x Series C1 C2 A OUT ISS CE ⋅ CE ∗ C1=C2=Tantalum VOUT <1.0V) C1 =C2=Ceramic1.0µF (VOUT > = 1.0V) Standard Test Circuit Supply Current Test Circuit Generator VDD GND OUT R1131x Series C2 P.G IOUT Pulse ∗ C2=Tantalum VOUT <1.0V) C2 =Ceramic1.0µF (VOUT > = 1.0V) CE ⋅ CE Generator VDD GND OUT R1131x Series C2 P.G IOUT Pulse ∗ C2=Tantalum VOUT <1.0V) C2 =Ceramic1.0µF (VOUT > = 1.0V) CE ⋅ CE Ripple Rejection, Line Transient Response Load Transient Response Test Circuit Test Circuit Pulse Generato 0 V Set VOUT +10V ∗ Input signal waveform to CE pin is shown below. VDD GND OUT R1131x Series C1 C2 IOUT CE ⋅ CE ∗ C1=C2=Tantalum VOUT <1.0V) C1 =C2=Ceramic1.0µF (VOUT > = 1.0V) Turn on Speed vifh CE pin Test Circuit |
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