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CY7B9911V Datasheet(PDF) 8 Page - Cypress Semiconductor

Part # CY7B9911V
Description  High Speed Low Voltage Programmable Skew Clock Buffer
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY7B9911V Datasheet(HTML) 8 Page - Cypress Semiconductor

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CY7B9911V
3.3V RoboClock+™
Document Number: 38-07408 Rev. *D
Page 8 of 14
Maximum Ratings
Operating outside these boundaries may affect the performance
and life of the device. These user guidelines are not tested.
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied ............................................ –55°C to +125°C
Supply Voltage to Ground Potential................–0.5V to +7.0V
DC Input Voltage ............................................–0.5V to +7.0V
Output Current into Outputs (LOW)............................. 64 mA
Static Discharge Voltage........................................... > 2001V
(MIL-STD-883, Method 3015)
Latch up Current..................................................... > 200 mA
Operating Range
Range
Ambient Temperature
VCC
Commercial
0°C to +70°C
3.3V
± 10%
Electrical Characteristics
Over the Operating Range[5]
Parameter
Description
Test Conditions
CY7B9911V
Unit
Min
Max
VOH
Output HIGH Voltage
VCC = Min, IOH = –18 mA
2.4
V
VOL
Output LOW Voltage
VCC = Min, IOL = 35 mA
0.45
V
VIH
Input HIGH Voltage (REF and FB inputs only)
2.0
VCC
V
VIL
Input LOW Voltage (REF and FB inputs only)
–0.5
0.8
V
VIHH
Three Level Input HIGH Voltage (Test, FS,
xFn)[5]
Min
≤ V
CC ≤ Max
0.87 * VCC
VCC
V
VIMM
Three Level Input MID Voltage (Test, FS,
xFn)[5]
Min
≤ V
CC ≤ Max
0.47 * VCC 0.53 * VCC
V
VILL
Three Level Input LOW Voltage (Test, FS,
xFn)[5]
Min
≤ V
CC ≤ Max
0.0
0.13 * VCC
V
IIH
Input HIGH Leakage Current (REF and FB
inputs only)
VCC = Max, VIN = Max
20
μA
IIL
Input LOW Leakage Current (REF and FB
inputs only)
VCC = Max, VIN = 0.4V
–20
μA
IIHH
Input HIGH Current (Test, FS, xFn)
VIN = VCC
200
μA
IIMM
Input MID Current (Test, FS, xFn)
VIN = VCC/2
–50
50
μA
IILL
Input LOW Current (Test, FS, xFn)
VIN = GND
–200
μA
IOS
Short Circuit Current[7]
VCC = MAX, VOUT = GND (25° only)
–200
mA
ICCQ
Operating Current Used by Internal Circuitry
VCCN = VCCQ = Max, All
Input Selects Open
Com’l
95
mA
Mil/Ind
100
ICCN
Output Buffer Current per Output Pair[8]
VCCN = VCCQ = Max,
IOUT = 0 mA Input Selects Open, fMAX
19
mA
PD
Power Dissipation per Output Pair[9]
VCCN = VCCQ = Max,
IOUT = 0 mA Input Selects Open, fMAX
104
mW
Notes
5. For more information see Group A subgroup testing information
.
6. These inputs are normally wired to VCC, GND, or left unconnected (actual threshold voltages vary as a percentage of VCC). Internal termination resistors hold
unconnected inputs at VCC/2. If these inputs are switched, the function and timing of the outputs glitch and the PLL may require an additional tLOCK time
before all data sheet limits are achieved.
7. CY7B9911V must be tested one output at a time, output shorted for less than one second, less than 10% duty cycle. Room temperature only.
8. Total output current per output pair is approximated by the following expression that includes device current plus load current:
CY7B9911V: ICCN = [(4 + 0.11F) + [[((835 –3F)/Z) + (.0022FC)]N] x 1.1
Where
F = frequency in MHz
C = capacitive load in pF
Z = line impedance in ohms
N = number of loaded outputs; 0, 1, or 2
FC = F < C
9. Total power dissipation per output pair is approximated by the following expression that includes device power dissipation plus power dissipation due to the
load circuit:
PD = [(22 + 0.61F) + [[(1550 + 2.7F)/Z) + (.0125FC)]N] x 1.1. (See note 8 for variable definition.)


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